CS61583 datasheet(19/44 Pages) CIRRUS

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The test data register selected by the current in-

struction retains its previous value during this

state.

The instruction does not change in this

state.

Pause-DR State

The pause state allows the test controller to tem-

porarily halt the shifting of data through the test

data register in the serial path between J-TDI and

J-TDO. For example, this state could be used to

allow the tester to reload its pin memory from

disk during application of a long test sequence.

The test data register selected by the current in-

struction retains its previous value during this

state. The instruction does not change in this

state.

The controller remains in this state as long as

J-TMS is low.

When J-TMS goes high and a

rising edge is applied to J-TCK, the controller

moves to the Exit2-DR state.

Exit2-DR State

This is a temporary state. While in this state, if

J-TMS is held high, a rising edge applied to J-

T C K c au s es t h e c o n t rol ler to enter the

Update-DR state, which terminates the scanning

process. If J-TMS is held low and a rising edge

is applied to J-TCK, the controller enters the

Shift-DR state.

The test data register selected by the current in-

struction retains its previous value during this

state. The instruction does not change in this

state.

Update-DR State

The Boundary Scan Register is provided with a

latched parallel output to prevent changes while

data is shifted in response to the EXTEST and

SAMPLE/PRELOAD instructions.

When the

TAP controller is in this state and the Boundary

Scan Register is selected, data is latched into the

parallel output of this register from the shift-reg-

ister path on the falling edge of J-TCK.

The

data held at the latched parallel output changes

only in this state.

All shift-register stages in the test data register

selected by the current instruction retains their

previous value during this state. The instructions

does not change in this state.

Select-IR-Scan State

This is a temporary controller state.

The test

data register selected by the current instruction

retains its previous state. If J-TMS is held low

and a rising edge is applied to J-TCK when in

this state, the controller moves into the Capture-

IR state, and a scan sequence for the instruction

rising edge is applied to J-TCK, the controller

moves to the Test-Logic-Reset state.

The in-

struction does not change in this state.

Capture-IR State

In this controller state, the shift register con-

tained in the instruction register loads a fixed

value of "01" on the rising edge of J-TCK. This

supports fault-isolation of the board-level serial

test data path.

Data registers selected by the current instruction

retain their value during this state. The instruc-

tions does not change in this state.

When the controller is in this state and a rising

edge is applied to J-TCK, the controller enters

the Exit1-IR state if J-TMS is held high, or the

Shift-IR state if J-TMS is held low.

Shift-IR State

In this state, the shift register contained in the

instruction register is connected between J-TDI

and J-TDO and shifts data one stage towards its

serial output on each rising edge of J-TCK.

CS61583

DS172PP5

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