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ADM3055EBRIZ датащи(PDF) 10 Page - Analog Devices |
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ADM3055EBRIZ датащи(HTML) 10 Page - Analog Devices |
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10 / 24 page ![]() ADM3055E/ADM3057E Data Sheet Rev. A | Page 10 of 24 Table 8. ADM3057E VDE Characteristics Description Test Conditions/Comments Symbol Characteristic Unit Installation Classification per DIN VDE 0110 For Rated Mains Voltage ≤ 150 V rms I to IV For Rated Mains Voltage ≤ 300 V rms I to IV For Rated Mains Voltage ≤ 400 V rms I to III Climatic Classification 40/105/21 Pollution Degree per DIN VDE 0110, Table 1 2 Maximum Working Insulation Voltage VIORM 849 VPEAK Input to Output Test Voltage, Method B1 VIORM × 1.875 = VPR, 100% production test, tm = 1 sec, partial discharge < 5 pC Vpd(m) 1592 VPEAK Input to Output Test Voltage, Method A After Environmental Tests Subgroup 1 VIORM × 1.5 = Vpd(m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC Vpd(m) 1273 VPEAK After Input or Safety Test Subgroup 2 and Subgroup 3 VIORM × 1.2 = Vpd(m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC Vpd(m) 1018 VPEAK Highest Allowable Overvoltage Transient overvoltage, tTR = 10 sec VIOTM 6000 VPEAK Surge Isolation Voltage Reinforced VIOSM(TEST) = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time VIOSM 6000 VPEAK Safety Limiting Values Maximum value allowed in the event of a failure (see Figure 7) Case Temperature TS 150 °C Total Power Dissipation at 25°C PS 2.35 W Insulation Resistance at TS VIO = 500 V RS >109 Ω 0 0.5 1.0 1.5 2.0 2.5 3.0 0 50 100 150 200 AMBIENT TEMPERATURE (°C) Figure 6. ADM3055E Thermal Derating Curve, Dependence of Safety Limiting Values with Ambient Temperature per DIN V VDE V 0884-10 0 0.5 1.0 1.5 2.0 2.5 3.0 0 50 100 150 200 AMBIENT TEMPERATURE (°C) Figure 7. ADM3057E Thermal Derating Curve, Dependence of Safety Limiting Values with Ambient Temperature per DIN V VDE V 0884-10 |
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