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ADA4945-1ACPZ-R2 датащи(PDF) 40 Page - Analog Devices

номер детали ADA4945-1ACPZ-R2
подробное описание детали  High Speed Offset Drift Fully Differential ADC Driver
PDF  44 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
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ADA4945-1ACPZ-R2 датащи(HTML) 40 Page - Analog Devices

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ADA4945-1
Data Sheet
Rev. 0 | Page 40 of 44
INPUT COMMON-MODE VOLTAGE RANGE
The input common-mode range at the summing nodes of the
ADA4945-1 is specified as −VS to +VS − 1.3 V. By extending the
input common-mode range down to −VS, the ADA4945-1 is
especially well suited to dc-coupled, single-ended-to-differential,
and single-supply applications, such as ADC driving.
INPUT AND OUTPUT CAPACITIVE AC COUPLING
Although the ADA4945-1 is best suited to dc-coupled applications,
it is possible to use the device in ac-coupled circuits. Input ac
coupling capacitors can be inserted between the source and RG.
This ac coupling blocks the flow of the dc common-mode
feedback current and causes the ADA4945-1 dc input common-
mode voltage to equal the dc output common-mode voltage.
These ac coupling capacitors must be placed in both loops to keep
the feedback factors matched. Output ac coupling capacitors can
be placed in series between each output and the respective load
of each output.
SETTING THE OUTPUT COMMON-MODE VOLTAGE
The VOCM pin of the ADA4945-1 is internally biased at a voltage
approximately equal to the midway between the output voltage
clamps, ((+VCLAMP) + (−VCLAMP))/2. Relying on this internal bias
results in an output common-mode voltage that is within
approximately 100 mV of the expected value.
When more accurate control of the output common-mode level is
required, it is recommended that an external source, or resistor
divider (10 kΩ or greater resistors), be used. The output
common-mode offset listed in Table 2, Table 5, and Table 8
assumes that the VOCM input is driven by a low impedance voltage
source.
It is also possible to connect the VOCM input to a common-mode
level (CML) output of an ADC. However, care must be taken to
ensure that the output has sufficient drive capability. The input
impedance of the VOCM pin is approximately 125 kΩ.
DISABLE PIN
The ADA4945-1 features a DISABLE pin that can be used to
minimize the quiescent current consumed when the device is
not being used. DISABLE is asserted by applying a low logic level
to the DISABLE pin. The logic level for the DISABLE pin is
referenced to DGND. See Table 3, Table 6, and Table 9 for the
threshold limits.
The DISABLE pin features an internal pull-up network that
enables the amplifier for normal operation. The ADA4945-1
DISABLE pin can be left floating (that is, no external
connection is required) and does not require an external pull-
up resistor to ensure normal on operation (see Figure 110).
When the ADA4945-1 is disabled, the output is high impedance.
Note that the outputs are tied to the inputs through the feedback
resistors and to the source using the gain resistors. In addition,
there are back to back diodes on the input pins that limit the
differential voltage to 1.2 V.
DISABLE
AMPLIFIER
BIAS CURRENT
–VS
+VS
DGND
Figure 110. DISABLE Pin Circuit
DRIVING A CAPACITIVE LOAD
A purely capacitive load reacts with the bond wire and pin
inductance of the ADA4945-1, resulting in high frequency
ringing in the transient response and loss of phase margin. One
way to minimize this effect is to place a resistor in series with
each output to buffer the load capacitance. The resistor and load
capacitance form a first-order, low-pass filter. Therefore, the
resistor value must be as small as possible. In some cases, the
ADCs require small series resistors to be added on their inputs.
Figure 111 shows the capacitive load vs. the series resistance
required to maintain a minimum 45° of phase margin. The test
circuit is shown in Figure 112.
35
0
10
100
1000
5
10
15
20
30
LOAD CAPACITANCE (pF)
25
FULL POWER MODE
LOW POWER MODE
Figure 111. Series Resistance vs. Load Capacitance
+IN
–OUT
+OUT
–FB
+FB
–IN
VOCM
0.1µF
RS
RS
R1
CL
CL
R2
R4
+5V
–5V
R3
VIN
Figure 112. Series Resistance with a Capacitive Load Test Circuit



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