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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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S29CD032G датащи(PDF) 72 Page - SPANSION |
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S29CD032G датащи(HTML) 72 Page - SPANSION |
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72 / 93 page  72 S29CD032G 30606B0 March 22, 2004 Ad va n c e In f o rm a t i o n Test Conditions Table 22. Test Specifications Key to Switching Waveforms Switching Waveforms Test Condition 54D, 64C 65A, 75E Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0 V – VIO V Input timing measurement reference levels VIO/2 V Output timing measurement reference levels VIO/2 V Figure 12. Test Setup Note: Diodes are IN3064 or equivalent CL Device Under Test Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VIO VSS VIO/2 V VIO/2 V Output Measurement Level Input Figure 13. Input Waveforms and Measurement Levels |
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