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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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HT69F360 датащи(PDF) 26 Page - Holtek Semiconductor Inc |
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HT69F360 датащи(HTML) 26 Page - Holtek Semiconductor Inc |
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26 / 235 page  Rev. 1.30 �� �ove��e� 1�� �01� Rev. 1.30 �7 �ove��e� 1�� �01� HT69F340/HT69F350/HT69F360 TinyPowerTM I/O Flash MCU with LCD & EEPROM HT69F340/HT69F350/HT69F360 TinyPowerTM I/O Flash MCU with LCD & EEPROM Pad Name Function OPT I/T O/T Description V1 V1 — — AO LCD voltage pu�p VMAX VMAX — PWR — IC �axi�u� voltage� connect to VDD� VLCD o� V1 VLCD VLCD — PWR — LCD powe� supply VDD VDD — PWR — Powe� supply VSS VSS — PWR — G�ound Legend: I/T:Inputtype O/T:Outputtype OPT:Optionalbyconfigurationoption(CO)orregisteroption PWR:Power CO:Configurationoption ST:SchmittTriggerinput CMOS:CMOSoutput NMOS:NMOSoutput AO:Analogoutput HXT:Highfrequencycrystaloscillator LXT:Lowfrequencycrystaloscillator Absolute Maximum Ratings SupplyVoltage....................................................................................................VSS-0.3VtoVSS+6.0V InputVoltage.......................................................................................................VSS-0.3VtoVDD+0.3V StorageTemperature...................................................................................................... -50°Cto125°C OperatingTemperature....................................................................................................-40°Cto85°C IOLTotal........................................................................................................................................ 80mA IOHTotal.......................................................................................................................................-80mA TotalPowerDissipation............................................................................................................ 500mW Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder“Absolute MaximumRatings”maycausesubstantialdamagetothedevice.Functionaloperationofthis deviceatotherconditionsbeyondthoselistedinthespecificationisnotimpliedandprolonged exposuretoextremeconditionsmayaffectdevicereliability. |
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