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TP3094 датащи(PDF) 7 Page - National Semiconductor (TI) |
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TP3094 датащи(HTML) 7 Page - National Semiconductor (TI) |
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7 / 19 page ![]() 7 www.national.com bypassing the low frequency filter. Where A0, A1 select the channel under test, ac- cording to the following table Test Modes TST PDN0 PDN1 PDN2 PDN3 Description Normal Operation 0 x x x x Single Channel Digital Loopback 1 1 1 A0 A1 Ch. select with PDN2, PDN3 Single Channel Analog Loopback 1 0 1 A0 A1 Ch. select with PDN2, PDN3 Single Channel DC Conversion 1 1 0 A0 A1 Ch. select with PDN2, PDN3 4 Channels Digital Loopback 1 0 0 0 0 4 Channels Analog Loopback 1 0 0 0 1 4 Channels DC Conversion 1 0 0 1 0 Invalid States 1 0 0 1 1 A0 A1 Channel Selected 0 0 Channel 0 1 0 Channel 1 0 1 Channel 2 1 1 Channel 3 Functional Description (continued) |
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