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SCANPSC110FDMQB датащи(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали SCANPSC110FDMQB
подробное описание детали  SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
PDF  29 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
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Hierarchical Test Support
Multiple SCANPSC110F Bridges can be used to assemble a
hierarchical boundary-scan tree. In such a configuration, the
system tester can configure the local ports of a set of
’PSC110Fs so as to connect a specific set of local
scan-chains to the active scan chain. Using this capability,
the tester can selectively communicate with specific portions
of a target system.
The tester’s scan port is connected to the backplane scan
port of a “root” layer of ’PSC110Fs, each of which can be se-
lected using multi-drop addressing. A second tier of
’PSC110Fs can be connected to this root layer, by connect-
ing a local port (LSP) of a root-layer ’PSC110F to the back-
plane port of a second-tier ’PSC110F. This process can be
continued to construct a multi-level scan hierarchy.
’PSC110F
local
ports
which
are
not
cascaded
into
higher-level ’PSC110Fs can be thought of as the terminal
“leaves” of a scan “tree”. The test master can select one or
more target leaves by selecting and configuring the local
ports of an appropriate set of ’PSC110Fs in the test tree.
Level 1 Protocol
ADDRESSING MODES
The SCANPSC110F Bridge supports “single” and “multiple”
modes of addressing a ’PSC110F. The “single” mode will se-
lect one ’PSC110F and is called Direct Addressing. More
than one ’PSC110F device can be selected via the Broad-
cast and Multi-Cast Addressing modes.
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