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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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SCANPSC110FDMQB датащи(PDF) 5 Page - National Semiconductor (TI) |
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SCANPSC110FDMQB датащи(HTML) 5 Page - National Semiconductor (TI) |
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5 / 29 page  Overview of SCANPSC110F Bridge Functions (Continued) In multi-drop scan systems, a scan tester can select indi- vidual ’PSC110Fs for participation in upcoming scan opera- tions. ’PSC110F “selection” is accomplished by simulta- neously scanning a device address out to multiple ’PSC110Fs. Through an on-chip address matching process, only those ’PSC110Fs whose statically-assigned address matches the scanned-out address become selected to re- ceive further instructions from the scan tester. ’PSC110F se- lection is done using a “Level-1” protocol, while follow-on in- structions are sent to selected ’PSC110Fs by using a “Level-2” protocol. The ’PSC110F contains three distinct but coupled state-machines (see Figure 2 ). The first of these is the TAP-control state-machine, which is used to drive the ’PSC110Fs scan ports in conformance with the 1149.1 Stan- dard (see Figure 17 of appendix). The second is the ’PSC110F-selection state-machine ( Figure 3). The third state-machine actually consists of three identical but inde- pendent state-machines (see Figure 4), one per ’PSC110F local scan port. Each of these scan port-selection state-machines allows individual local ports to be inserted into and removed from the ’PSC110Fs overall scan chain. The ’PSC110F selection state-machine performs the ad- dress matching which gives the ’PSC110F its multi-drop ca- pability. That logic supports single-’PSC110F access, multi-cast, and broadcast. The ’PSC110F-selection state-machine implements the chip’s Level-1 protocol. DS100327-4 FIGURE 2. SCANPSC110F Bridge State Machines www.national.com 5 |
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