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STGAP1ASTR датащи(PDF) 38 Page - STMicroelectronics

номер детали STGAP1ASTR
подробное описание детали  Automotive galvanically isolated advanced single gate driver
PDF  70 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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STGAP1ASTR датащи(HTML) 38 Page - STMicroelectronics

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Functional description
STGAP1AS
38/70
DocID029344 Rev 2
7.14.2
GOFF to gate path check
The purpose of this security check is to verify the path integrity including the driver's GOFF
output, the GOFF (turn-off) gate resistor, the power switch gate and the CLAMP pin (see
Figure 17
).
To perform this test, the following procedure has to be followed:
Set SD = low
Send StartConfig command
Set GOFFCHK = '1'
Send StopConfig command
Wait tGchk + tGATE_GOFFchk
Read DESAT flag
DESAT = '0' → OK (VCLAMP < VCLAMPth)
DESAT = '1' → FAIL (VCLAMP > VCLAMPth)
During the check a small current IGOFFchk will be sourced from the CLAMP pin while GOFF
is on keeping the gate low through the turn-off gate resistor.
To ensure the check result, some applicative conditions have to be verified:
The bleeding resistor, sometimes present between the gate and source in the
power switch, shall be higher than 8.2 k
.
During the test, the power switch gate shall have the time to be charged up to
VCLAMPth by IGOFFchk. In case no bleeding resistor is present, this time can be
roughly computed as:
tGATE_GOFFchk ≈ CGATE * (VCLAMPth - VL) / IGOFFchk
If a bleeding resistor is present or an additional push-pull circuit has been added,
the time has to be computed with the adequate corrective factors.
If the check fails due to the lack of the GOFF resistor, the power switch gate will gradually
rise up to VH with no protections of SENSE nor DESAT. The user test routine shall consider
this behavior.



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