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DS20005045C-page 19

SST25VF080B

TABLE 5-5:

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Minimum Specification

Units

Test Method

1

Endurance

10,000

Cycles

JEDEC Standard A117

1

Data Retention

100

Years

JEDEC Standard A103

1

Latch Up

mA

JEDEC Standard 78

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

TABLE 5-6:

AC OPERATING CHARACTERISTICS

Symbol

Parameter

25 MHz

50 MHz

2. Characterized, but not fully tested

Units

Min

Max

Min

Max

Min

Max

3

3. Maximum clock frequency for Read Instruction, 03H, is 25 MHz

Serial Clock Frequency

25

50

66

MHz

Serial Clock High Time

18

9

7

ns

Serial Clock Low Time

18

9

7

ns

4

Serial Clock Rise Time (Slew

Rate)

0.1

0.1

0.1

V/ns

Serial Clock Fall Time (Slew

Rate)

0.1

0.1

0.1

V/ns

5

5. Relative to SCK.

CE# Active Setup Time

10

5

4

ns

TCEH

5

CE# Active Hold Time

10

5

4

ns

5

CE# Not Active Setup Time

10

5

4

ns

5

CE# Not Active Hold Time

10

5

4

ns

CE# High Time

100

50

100

ns

CE# High to High-Z Output

15

8

6

ns

SCK Low to Low-Z Output

000

ns

Data In Setup Time

522

ns

Data In Hold Time

553

ns

HOLD# Low Setup Time

10

5

4

ns

HOLD# High Setup Time

10

5

4

ns

HOLD# Low Hold Time

10

5

4

ns

HOLD# High Hold Time

10

5

4

ns

HOLD# Low to High-Z Output

20

8

8

ns

HOLD# High to Low-Z Output

15

8

8

ns

Output Hold from SCK Change

000

ns

Output Valid from SCK

15

8

6

ns

Sector-Erase

25

25

25

ms

Block-Erase

25

25

25

ms

Chip-Erase

50

50

50

ms

Byte-Program

10

10

10

µs