 2014 Microchip Technology Inc.

DS20005164C-page 23

SST25WF080B

6.5

DC Characteristics

TABLE 6-5:

DC OPERATING CHARACTERISTICS

Symbol

Parameter

Limits

Test Conditions

Min

1. Value characterized, not fully tested in production.

Max

Units

Read Current

6

mA

SO=open; Single I/O

Read Current

8

mA

SO=open

Read Current

10

mA

SO=open; Dual I/O;

Program and Erase Current

15

mA

Standby Current

50

μA

Deep Power-Down

10

μA

Input Leakage Current

2

Output Leakage Current

2

Input Low Voltage

-0.3

0.3

V

Input High Voltage

V

Output Low Voltage

0.2

V

Output High Voltage

V

TABLE 6-6:

Parameter

Description

Test Condition

Maximum

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Output Pin Capacitance

12 pF

Input Capacitance

6 pF

TABLE 6-7:

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Minimum Specification

Units

Test Method

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance

100,000

Cycles JEDEC Standard A117

Status Register Write Cycle

100,000

Cycles JEDEC Standard A117

Data Retention

20

Years

JEDEC Standard A103

Latch Up

mA

JEDEC Standard 78