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DS2155 датащи(PDF) 9 Page - Dallas Semiconductor

номер детали DS2155
подробное описание детали  T1/E1/J1 Single-Chip Transceiver TDM/UTOPIA II Interface
PDF  262 Pages
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производитель  DALLAS [Dallas Semiconductor]
домашняя страница  https://www.maximintegrated.com/en.html
Logo DALLAS - Dallas Semiconductor

DS2155 датащи(HTML) 9 Page - Dallas Semiconductor

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§ Flexible signaling support
–
Software or hardware based
–
Interrupt generated on change of signaling data
–
Receive signaling freeze on loss-of-sync,
carrier loss, or frame slip
§ Addition of hardware pins to indicate carrier loss
and signaling freeze
§ Automatic RAI generation to ETS 300 011
specifications
§ Access to Sa and Si bits
§ Option to extend carrier loss criteria to a 1ms
period as per ETS 300 233
§ Japanese J1 support
–
Ability to calculate and check CRC6 according
to the Japanese standard
–
Ability to generate Yellow Alarm according to
the Japanese standard
TDM Bus
§ Dual two-frame independent receive and transmit
elastic stores
–
Independent control and clocking
–
Controlled slip capability with status
–
Minimum delay mode supported
§ 16.384MHz maximum backplane burst rate
§ Supports T1 to CEPT (E1) conversion
§ Programmable output clocks for fractional T1, E1,
H0, and H12 applications
§ Interleaving PCM bus operation
§ Hardware signaling capability
–
Receive signaling reinsertion to a backplane
multiframe sync
–
Availability of signaling in a separate PCM
data stream
–
Signaling freezing
§ Ability to pass the T1 F-bit position through the
elastic stores in the 2.048MHz backplane mode
§ Access to the data streams in between the
framer/formatter and the elastic stores
§ User-selectable synthesized clock output
UTOPIA Bus
§ Supports fractional T1/E1 and arbitrary bit rates in
multiples of 64kbps (DS0/TS) up to 2.048Mbps
§ Supports clear E1
§ Compliant to the ATM forum specifications for
ATM over DS1 and E1, respectively
§ Standard UTOPIA-II interface to the ATM layer
§ Configurable UTOPIA address
§ Supports diagnostic loopback
§ Optional payload scrambling in transmit direction
and descrambling in receive direction as per the
ITU I.432 for the cell-based physical layer
§ Optional HEC insertion in transmit direction with
programmable COSET polynomial addition
§ Option of using either idle or unassigned cells for
cell-rate decoupling in transmit direction
§ 1-Byte programmable pattern for payload of cells
used for cell-rate decoupling
§ Transmit FIFO depth configurable to either 2, 3, 4
cell deep, which provides control over cell latency
§ Transmit FIFO depth indication for 2-cell space
§ Optional single-bit HEC error insertion
§ HEC-based cell delineation
§ Optional single-bit HEC error correction in the
receive direction
§ Optional filtering of HEC errored cells received
§ Optional receive idle/unassigned cell filtering
§ Programmable loss-of-cell delineation (LCD)
integration and optional interrupt
§ Interrupt for FIFO overrun in receive direction
§ Saturating counts for:
–
Number of error-free assigned cells received
and transmitted
–
Number of correctable and uncorrectable HEC-
errored cells received
§ Optional internally generated clock (system clock
divided by 8) in diagnostic loopback mode
HDLC Controllers
§ Two independent HDLC controllers
§ Fast load and unload features for FIFOs
§ SS7 support for FISU transmit and receive
§ Independent 128-byte Rx and Tx buffers with
interrupt support
§ Access FDL, Sa, or single/multiple DS0 channels
§ DS0 access includes Nx64 or Nx56
§ Compatible with polled or interrupt driven
environments
§ Bit-oriented code (BOC) support
Test and Diagnostics
§ Programmable on-chip bit error-rate testing
§ Pseudorandom patterns including QRSS
§ User-defined repetitive patterns
§ Daly pattern
§ Error insertion single and continuous
§ Total bit and errored bit counts
§ Payload error insertion
§ Error insertion in the payload portion of the T1
frame in the transmit path
§ Errors can be inserted over the entire frame or
selected channels
§ Insertion options include continuous and absolute
number with selectable insertion rates
§ F-bit corruption for line testing
§ Loopbacks: remote, local, analog, and per-channel
loopback



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