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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM26C31CD датащи(PDF) 9 Page - Texas Instruments |
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AM26C31CD датащи(HTML) 9 Page - Texas Instruments |
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9 / 33 page  Enable G Input (see Note C) Output WIth 0 V to A Input VOL + 0.3 V tPLZ tPHZ tPZH tPZL C3 = 40 pF C2 = 40 pF C1 = 40 pF Input A 50 Ω 50 Ω 500 Ω TEST CIRCUIT VOLTAGE WAVEFORMS 3 V 0 V 1.5 V VOL VOH VOH - 0.3 V 1.5 V See Note A G G Enable G Input Output Output Output WIth 3 V to A Input Enable Inputs (see Note B) 0 V 3 V 1.5 V S1 1.3 V1.3 V 2 V 0.8 V 9 AM26C31 www.ti.com SLLS103O – DECEMBER 1990 – REVISED JUNE 2016 Product Folder Links: AM26C31 Submit Documentation Feedback Copyright © 1990–2016, Texas Instruments Incorporated Parameter Measurement Information (continued) Figure 4. Differential-Output Rise- and Fall-Time Waveforms and Test Circuit A. C1, C2, and C3 include probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, duty cycle ≤ 50%, and tr, tf ≤ 6 ns. C. Each enable is tested separately. Figure 5. Output Enable and Disable Time Waveforms and Test Circuit |
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