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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM26C31CD датащи(PDF) 8 Page - Texas Instruments |
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AM26C31CD датащи(HTML) 8 Page - Texas Instruments |
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8 / 33 page  Input A (see Note B) Output Y 1.3 V 50% tsk(p) Output Z tPHL tPLH tsk(p) tPLH tPHL C3 = 40 pF C2 = 40 pF C1 = 40 pF Input See Note A TEST CIRCUIT RL/2 RL/2 1.5 V 500 Ω S1 1.3 V 1.3 V 3 V 0 V 50% 50% 50% 8 AM26C31 SLLS103O – DECEMBER 1990 – REVISED JUNE 2016 www.ti.com Product Folder Links: AM26C31 Submit Documentation Feedback Copyright © 1990–2016, Texas Instruments Incorporated 7 Parameter Measurement Information Figure 2. Differential and Common-Mode Output Voltages A. C1, C2, and C3 include probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, duty cycle ≤ 50%, and tr, tf ≤ 6 ns. Figure 3. Propagation Delay Time and Skew Waveforms and Test Circuit A. C1, C2, and C3 include probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, duty cycle ≤ 50%, and tr, tf ≤ 6 ns. |
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