LPV521 datasheet(6/34 Pages) TI1

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LPV521

SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014

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6.7 3.3-V DC Electrical Characteristics

Unless otherwise specified, all limits for TA = 25°C, V

+ = 3.3 V, V− = 0 V, V

CM = VO = V

+/2, and R

L > 1 MΩ.

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOS

Input Offset Voltage

VCM = 0.3 V

–1

0.1

Temperature extremes

–1.23

1.23

VCM = 3 V

–1

0.1

Temperature extremes

–1.23

1.23

TCVOS

Input Offset Voltage Drift(2)

±0.4

μV/°C

Temperature extremes

–3

IBIAS

Input Bias Current

–1

0.01

Temperature extremes

–50

IOS

Input Offset Current

CMRR

Common Mode Rejection Ratio

0 V

≤ VCM ≤ 3.3 V

Temperature extremes

0 V

≤ VCM ≤ 2.2 V

106

Temperature extremes

2.7 V

≤ VCM ≤ 3.3 V

121

Temperature extremes

PSRR

Power Supply Rejection Ratio

1.6 V

≤ V+ ≤ 5.5 V

109

VCM = 0.3 V

Temperature extremes

CMRR

≥ 72 dB

−0.1

3.4

CMRR

≥ 70 dB

CMVR

Common Mode Voltage Range

Temperature extremes

3.3

VO = 0.5 V to 2.8 V

120

RL = 100 kΩ to V

+/2

AVOL

Large Signal Voltage Gain

Temperature extremes

Output Swing High

RL = 100 kΩ to V

+/2

VIN(diff) = 100 mV

Temperature extremes

from either

Output Swing Low

RL = 100 kΩ to V

+/2

rail

VIN(diff) = −100 mV

Temperature extremes

Output Current(3)

Sourcing, VO to V

–

VIN(diff) = 100 mV

Temperature extremes

Sinking, VO to V

VIN(diff) = −100 mV

Temperature extremes

Supply Current

VCM = 0.3 V

346

400

Temperature extremes

600

VCM = 3 V

471

600

Temperature extremes

860

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables

under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the

device may be permanently degraded, either mechanically or electrically.

(2)

The offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature

change.

(3)

The short circuit test is a momentary open-loop test.

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