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LPV521 датащи(PDF) 5 Page - Texas Instruments

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номер детали LPV521
подробное описание детали  NanoPower, 1.8-V, RRIO, CMOS Input, Operational Amplifier
PDF  34 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
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LPV521 датащи(HTML) 5 Page - Texas Instruments

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LPV521
www.ti.com
SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014
1.8-V DC Electrical Characteristics (continued)
Unless otherwise specified, all limits for TA = 25°C, V
+ = 1.8 V, V= 0 V, V
CM = VO = V
+/2, and R
L > 1 MΩ.
(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VO
Output Swing High
RL = 100 kΩ to V
+/2
2
50
VIN(diff) = 100 mV
Temperature extremes
50
mV from
either rail
Output Swing Low
RL = 100 kΩ to V
+/2
2
50
VIN(diff) = −100 mV
Temperature extremes
50
IO
Sourcing, VO to V
3
1
VIN(diff) = 100 mV
Temperature extremes
0.5
Output Current(3)
mA
Sinking, VO to V
+
3
1
VIN(diff) = −100 mV
Temperature extremes
0.5
IS
Supply Current
VCM = 0.3 V
345
400
Temperature extremes
580
nA
VCM = 1.5 V
472
600
Temperature extremes
850
(3)
The short circuit test is a momentary open-loop test.
6.6 1.8-V AC Electrical Characteristics
Unless otherwise specified, all limits for TA = 25°C, V
+ = 1.8 V, V= 0 V, V
CM = VO = V
+/2, and R
L > 1 MΩ.
(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
GBW
Gain-Bandwidth Product
CL = 20 pF, RL = 100 kΩ
6.1
kHz
SR
Slew Rate
AV = +1,
Falling Edge
2.9
V/ms
VIN = 0V to 1.8V
Rising Edge
2.3
θ m
Phase Margin
CL = 20 pF, RL = 100 kΩ
72
deg
Gm
Gain Margin
CL = 20 pF, RL = 100 kΩ
19
dB
en
Input-Referred Voltage Noise Density
f = 100 Hz
265
nV/
√Hz
Input-Referred Voltage Noise
0.1 Hz to 10 Hz
24
μVPP
In
Input-Referred Current Noise
f = 100 Hz
100
fA/
√Hz
(1)
Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables
under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
Copyright © 2009–2014, Texas Instruments Incorporated
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