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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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CDCVF2310MPWREP датащи(PDF) 8 Page - Texas Instruments |
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CDCVF2310MPWREP датащи(HTML) 8 Page - Texas Instruments |
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8 / 16 page  50% VDD 50% VDD CLK Yn tPLH tPHL NOTE: tsk(p) = | tPLH − tPHL | VDD 0 V VOL VOH 50% VDD 50% VDD VDD 0 V VOL VOH VOL VOH CLK Any Y Any Y tsk(o) tsk(o) 1.7 V or 2 V 0.4 V 0.4 V tPLH tPHL 50% VDD 50% VDD VDD 0 V VOH VOL tr tf CLK Yn 500 Ω CL = 25 pF on Yn From Output Under Test CDCVF2310-EP SCAS934 – DECEMBER 2012 www.ti.com PARAMETER MEASUREMENT INFORMATION A. CL includes probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 200 MHz, ZO = 50 Ω, tr < 1.2 ns, tf < 1.2 ns. Figure 2. Test Load Circuit Figure 3. Voltage Waveforms Propagation Delay Times Figure 4. Output Skew Figure 5. Pulse Skew 8 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: CDCVF2310-EP |
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