3.3 Absolute Maximum Ratings

Stresses above those listed in Table 3.8 Absolute Maximum Ratings on page 9 may cause permanent damage to the device. This is

a stress rating only and functional operation of the devices at those or any other conditions above those indicated in the operation list-

ings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. For

more information on the available quality and reliability data, see the Quality and Reliability Monitor Report at http://www.silabs.com/

support/quality/pages/default.aspx.

Table 3.8. Absolute Maximum Ratings

Parameter

Symbol

Test Condition

Min

Max

Unit

Ambient Temperature Under Bias

–55

125

°C

Storage Temperature

–65

150

°C

GND–0.3

4.0

V

Voltage on I/O pins or RSTb

GND–0.3

V

Total Current Sunk into Supply Pin

—

400

mA

Total Current Sourced out of Ground

Pin

400

—

mA

Current Sourced or Sunk by Any I/O

Pin or RSTb

–100

100

mA

Maximum Total Current through all

Port Pins

—

200

mA

Operating Junction Temperature

–40

105

°C

Exposure to maximum rating conditions for extended periods may affect device reliability.

CPT112S Data Sheet

Electrical Specifications

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