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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LP3997 датащи(PDF) 4 Page - Texas Instruments |
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LP3997 датащи(HTML) 4 Page - Texas Instruments |
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4 / 18 page  LP3997 SNVS272B – MAY 2004 – REVISED MAY 2013 www.ti.com Electrical Characteristics Unless otherwise noted, SD = 950mV, VIN = VOUT + 1.0V, CIN = 2.2 µF, IOUT = 1 mA, COUT = 2.2 µF and CBYP = 0.1 µF. Typical values and limits appearing in normal type apply for TJ = 27°C. Limits appearing in boldface type apply over the full temperature range for operation, −40 to +125°C. (1) Limit Symbol Parameter Test Conditions Typ Unit Min Max VIN Input Voltage 2 6 V ΔVOUT Output Voltage Tolerance Over full line and load regulation -1.5 +1.5 % -3 +3 Line Regulation Error VIN = (VOUT(NOM) + 1.0V) to 6.0V, 0.02 0.3 %/V IOUT = 1mA Load Regulation Error IOUT = 1mA to 250mA 20 80 µV/mA VDO Dropout Voltage(2) IOUT = 250mA 140 400 mV ILOAD Load Current See (3) (4) 0 µA IQ Quiescent Current SD = 950mV, IOUT = 0mA 55 100 SD = 950mV, IOUT = 250mA 80 150 µA SD = 0.4V 0.01 0.5 ISC Short Circuit Current Limit See (5) 600 1000 mA IOUT Maximum Output Current 250 mA PSRR Power Supply Rejection Ratio CBYP = 0.1µF f = 1kHz, IOUT = 61 1mA to 150mA f = 10kHz, IOUT = 55 150mA dB Without CBYP f = 1kHz, IOUT = 61 1mA to 150mA f = 10kHz, IOUT = 39 150mA w/o CBYP 180 BW = 10Hz to 100kHz, en Output noise Voltage(4) µVRMS VIN = VOUT(nom) +1V CBYP = 0.1µF 100 TSHUTDOWN Thermal Shutdown Temperature 150 °C Hysteresis 10 Shutdown Control Characteristics ISD Maximum Input Current at SD SD = 0.0V 0.01 µA Input SD = 6V (6) 1 VIL Low Input Threshold VIN = 2V to 6V 0.4 V VIH High Input Threshold VIN = 2V to 6V 0.95 V Error Flag Characteristics VTH Power Good Trip Threshold VIN Rising 95 91 99 %VOUT VHYST Hysteresis VIN Rising or Falling 2.5 %VOUT VOL ErrorError OutputOutput low ISINK = 2mA 0.1 0.4 V Voltage IOFF Error Output High Leakage ERROR = VOUT(NOM) 10 2000 nA IDELAY Delay Pin Current Source VOUT > 95% VOUT(NOM) 2.2 1.2 3 µA (1) All limits are ensured. All electrical characteristics having room-temperature limits are tested during production at TJ = 25°C or correlated using Statistical Quality Control methods. Operation over the temperature specification is ensured by correlating the electrical characteristics to process and temperature variations and applying statistical process control. (2) Dropout voltage is defined as the voltage difference between input and output when the output voltage drops 100mV below its nominal value. (3) The device maintains the regulated output voltage without the load. (4) This electrical specification is ensured by design. (5) Short circuit current is measured on the input supply line at the point when the short circuit condition reduces the output voltage to 5% of its nominal value. (6) SD Pin has 6M Ω typical, resistor connected to GND. 4 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated Product Folder Links: LP3997 |
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