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ICS831724I датащи(PDF) 6 Page - Integrated Device Technology

номер детали ICS831724I
подробное описание детали  LVCMOS interface levels for all control inputs
PDF  24 Pages
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производитель  IDT [Integrated Device Technology]
домашняя страница  http://www.idt.com
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ICS831724AKI REVISION A MAY 16, 2013
6
©2013 Integrated Device Technology, Inc
ICS831724I Data Sheet
DIFFERENTIAL CLOCK DATA MULTIPLEXER
Table 5B. HCSL AC Characteristics, VDD = 3.3V ± 0.3V, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between input paths on the same device, using the same input signal levels, measured at one specific output at the
differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 5: Measurement taken from differential waveform.
NOTE 6: Measurement from -150mV to +150mV on the differential waveform (derived from Q minus nQ). The signal must be monotonic
through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.
NOTE 7: TSTABLE is the time the differential clock must maintain a minimum ±150mV differential voltage after rising/falling edges before it is
allowed to drop back into the VRB ±100 differential range. See Parameter Measurement Information Section.
NOTE 8: Measurement taken from single-ended waveform.
NOTE 9: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 10: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
Notes continued on next page.
NOTE 11: Measured at crossing point where the instantaneous voltage value of the rising edge of Q equals the falling edge of nQ.
See Parameter Measurement Information Section
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
fOUT
Output Frequency
350
MHz
tjit
Buffer Additive Phase
Jitter, RMS
100MHz, Integration Range:
12kHz – 20MHz
0.357
0.480
ps
tPD
Propagation Delay;
NOTE 1, 3
Any CLK, nCLK to any Q, nQ
2.7
3.9
ns
tsk(o)
Output Skew; NOTE 3,15
Across all outputs
175
ps
tsk(i)
Input Skew; NOTE 2, 3
165
ps
tsk(pp)
Part-to-Part Skew;
NOTE 3, 4
450
ps
MUXISOL
Mux Isolation
ƒ = 100MHz
94
dB
Rising
Edge Rate
Rising Edge Rate;
NOTE 5, 6
fOUT 125MHz
0.6
4.2
V/ns
fOUT 125MHz
0.6
6.8
V/ns
Falling
Edge Rate
Falling Edge Rate;
NOTE 5, 6
fOUT 125MHz
0.6
4.5
V/ns
fOUT 125MHz
0.6
6.7
V/ns
TSTABLE
Time before VRB is
allowed; NOTE 5, 7
500
ps
VRB
Ringback Voltage;
NOTE 5, 7
-100
100
mV
VMAX
Absolute Maximum Output
Voltage; NOTE 8, 9
1150
mV
VMIN
Absolute Minimum Output
Voltage; NOTE 8, 10
-300
mV
VCROSS
Absolute Crossing Voltage;
NOTE 8, 11, 12
200
550
mV
V
CROSS
Total Variation of VCROSS
over all edges;
NOTE 8, 11, 13
140
mV
odc
Output Duty Cycle;
NOTE 14
fOUT 125MHz
46
54
%
fOUT 125MHz
40
60
%



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