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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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THS4532IPW датащи(PDF) 3 Page - National Semiconductor (TI) |
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THS4532IPW датащи(HTML) 3 Page - National Semiconductor (TI) |
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3 / 44 page  THS4532 www.ti.com SLOS829 – FEBRUARY 2013 ELECTRICAL CHARACTERISTICS: VS = 2.7 V Test conditions at TA = 25°C, VS+ = 2.7 V, VS– = 0 V, VOCM = open, VOUT = 2 VPP, RF = 2 kΩ, RL = 2 kΩ differential, G = 1 V/V, single-ended input, differential output, and input and output referenced to mid-supply, unless otherwise noted. TEST PARAMETER CONDITIONS MIN TYP MAX UNITS LEVEL(1) AC PERFORMANCE VOUT = 100 mVPP, G = 1 34 VOUT = 100 mVPP, G = 2 16 Small-signal bandwidth MHz VOUT = 100 mVPP, G = 5 6 VOUT = 100 mVPP, G = 10 2.7 Gain-bandwidth product VOUT = 100 mVPP, G = 10 27 MHz Large-signal bandwidth VOUT = 2 VPP, G = 1 34 MHz Bandwidth for 0.1-dB flatness VOUT = 2 VPP, G = 1 12 MHz Slew rate, rise/fall, 25% to 75% 190/320 V/µs Rise/fall time, 10% to 90% 5.2/6.1 ns Settling time to 1%, rise/fall 25/20 VOUT = 2-V step ns Settling time to 0.1%, rise/fall 60/60 Settling time to 0.01%, rise/fall 150/110 ns Overshoot/undershoot, rise/fall 1/1 % f = 1 kHz, VOUT = 1 VRMS –122 2nd-order harmonic distortion f = 10 kHz –127 dBc C f = 1 MHz –59 f = 1 kHz, VOUT = 1 VRMS –130 3rd-order harmonic distortion f = 10 kHz –135 dBc f = 1 MHz –70 2nd-order intermodulation distortion –83 f = 1 MHz, 200-kHz tone spacing, dBc VOUT envelope = 2 VPP 3rd-order intermodulation distortion –81 Input voltage noise f = 1 kHz 10 nV/ √Hz Voltage noise 1/f corner frequency 45 Hz Input current noise f = 100 kHz 0.25 pA/ √Hz Current noise 1/f corner frequency 6.5 kHz Overdrive recovery time Overdrive = 0.5 V 65 ns Output balance error VOUT = 100 mV, f = 1 MHz –65 dB Closed-loop output impedance f = 1 MHz (differential) 2.5 Ω Channel-to-channel crosstalk f = 10 kHz, measured differentially -133 dB (1) Test levels (all values set by characterization and simulation): (A) 100% tested at +25°C; over temperature limits by characterization and simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information. Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links :THS4532 |
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