STM32F102XB datasheet(67/80 Pages) STMICROELECTRONICS

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STM32F102x8, STM32F102xB

Electrical characteristics

Table 46. RAIN max for fADC = 12 MHz(1)

1. Data guaranteed by design, not tested in production.

Ts (cycles)

tS (µs)

RAIN max (kΩ)

1.5

0.13

0.4

7.5

0.63

5.9

13.5

1.13

11.4

28.5

2.38

25.2

41.5

3.46

37.2

55.5

4.63

71.5

5.96

239.5

19.96

Table 47. ADC accuracy - limited test conditions(1)

1. ADC DC accuracy values are measured after internal calibration.

Symbol

Parameter

Test conditions

Typ

Max(2)

2. Based on characterization, not tested in production.

Unit

Total unadjusted error

fPCLK2 = 48 MHz,

fADC = 12 MHz, RAIN < 10 kΩ,

VDDA = 3 V to 3.6 V

TA = 25 °C

Measurements made after

ADC calibration

±1.3

±2

LSB

Offset error

±1

±1.5

Gain error

±0.5

±1.5

Differential linearity error

±0.7

±1

Integral linearity error

±0.8

±1.5

Table 48. ADC accuracy(1) (2) (3)

1. ADC DC accuracy values are measured after internal calibration.

2. Better performance could be achieved in restricted VDD, frequency and temperature ranges.

3. ADC accuracy vs. negative injection current: Injecting a negative current on any analog input pins should

be avoided as this significantly reduces the accuracy of the conversion being performed on another analog

input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially

inject negative currents.

Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.13 does not

affect the ADC accuracy.

Symbol

Parameter

Test conditions

Typ

Max(4)

4. Based on characterization, not tested in production.

Unit

Total unadjusted error

fPCLK2 = 48 MHz,

fADC = 12 MHz, RAIN < 10 kΩ,

VDDA = 2.4 V to 3.6 V

Measurements made after

ADC calibration

±2

±5

LSB

Offset error

±1.5

±2.5

Gain error

±1.5

±3

Differential linearity error

±1

±2

Integral linearity error

±1.5

±3

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