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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TAS5707APHPR датащи(PDF) 2 Page - Texas Instruments |
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TAS5707APHPR датащи(HTML) 2 Page - Texas Instruments |
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2 / 58 page  SDIN LRCLK SCLK MCLK RESET PDN SDA PLL_FLTM PLL_FLTP AVDD/DVDD PVDD OUT_A OUT_C OUT_B OUT_D BST_A BST_C BST_B BST_D 3.3V 8V–26V SCL Digital Audio Source I C Control 2 Control Inputs LC LC Left Right B0264-11 Loop Filter (1) TAS5707, TAS5707A SLOS556B – NOVEMBER 2008 – REVISED NOVEMBER 2009 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. SIMPLIFIED APPLICATION DIAGRAM (1)See user's guide for loop-filter details. 2 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5707 TAS5707A |
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