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ADF4196BCPZ датащи(PDF) 13 Page - Analog Devices |
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ADF4196BCPZ датащи(HTML) 13 Page - Analog Devices |
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13 / 28 page ![]() Data Sheet ADF4196 Rev. B | Page 13 of 28 DIFFERENTIAL AMPLIFIER The internal, low noise, differential-to-single-ended amplifier converts the differential charge pump output to a single-ended control voltage for the tuning port of the VCO. Figure 26 shows a simplified schematic of the differential amplifier. The output voltage is equal to the differential voltage, offset by the voltage on the CMR pin, according to the following equation: VAOUT = (VAIN+ − VAIN−) + VCMR (2) The CMR offset voltage is internally biased to three-fifths of VP3, the differential amplifier power supply voltage, as shown in Figure 26. Connect a 0.1 µF capacitor to the ground plane from the CMR pin to roll off the thermal noise of the biasing resistors. AIN– AOUT AIN+ CMR VP3 C EXT = 0.1µF 20kΩ 30kΩ 500Ω 500Ω 500Ω 500Ω Figure 26. Differential Amplifier Block Diagram As shown in Figure 15, the differential amplifier output voltage behaves according to Equation 2 over a 4 V range from ~1.2 V minimum up to VP3 − 0.3 V maximum. However, fast settling is guaranteed over a tuning voltage range from 1.8 V up to VP3 − 0.8 V only. This range allows sufficient room for overshoot in the PLL frequency settling transient. Noise from the differential amplifier is suppressed inside the PLL loop bandwidth. For loop bandwidths of >20 kHz, the 1/f noise has a negligible effect on the PLL output phase noise. Outside the loop bandwidth, the FM noise of the differential amplifier modulates the VCO. The passive filter network following the differential amplifier (see Figure 37) suppresses this noise contribution to below the VCO noise from offsets of 400 kHz and greater. This network has a negligible effect on lock time because it is bypassed when SW3 is closed while the loop is locking. MUXOUT AND LOCK DETECT MUXOUT Control The output multiplexer on the ADF4196 allows the user to access various internal points on the chip. The state of MUXOUT is controlled by Bits[M4:M1] in the mux register. Figure 35 shows the full truth table; see Figure 27 for a block diagram of the MUXOUT circuit. R DIVIDER OUTPUT N DIVIDER OUTPUT SERIAL DATA OUTPUT DGND DVDD CONTROL MUX MUXOUT LOGIC LOW THREE-STATE OUTPUT TIMER OUTPUTS DIGITAL LOCK DETECT LOGIC HIGH NOTE: 1. NOT ALL MUXOUT MODES THAT ARE SHOWN REFER TO THE MUX REGISTER. Figure 27. MUXOUT Circuit Lock Detect MUXOUT can be programmed to provide a digital lock detect signal. Digital lock detect is active high. Its output goes high if there are 40 successive PFD cycles with an input error of <3 ns. For reliable lock detect operation with RF frequencies of <2 GHz, it is recommended that this threshold be increased to 10 ns by programming Register R6. The digital lock detect goes low again when a new channel is programmed or when the error at the PFD input exceeds 30 ns for one or more cycles. INPUT SHIFT REGISTER The ADF4196 serial interface includes a 24-bit input shift register. Data is clocked in, MSB first, on each rising edge of CLK. Data from the shift register is latched into one of eight control registers, R0 to R7, on the rising edge of load enable (LE) The destination register is determined by the state of the three control bits: C3 (DB2), C2 (DB1), and C1 (DB0) in the shift register. DB2, DB1, and DB0 are the three LSBs, as shown in the timing diagram in Figure 2. The truth table for these bits is shown in Table 6. Figure 28 shows a summary of how the registers are programmed. Table 6. C3, C2, and C1 Truth Table Control Bits C3 (DB2) C2 (DB1) C1 (DB0) Register Name Register 0 0 0 FRAC/INT R0 0 0 1 MOD/R R1 0 1 0 Phase R2 0 1 1 Function R3 1 0 0 Charge pump R4 1 0 1 Power-down R5 1 1 0 Mux R6 1 1 1 Test mode R7 |
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