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ADF4196BCPZ датащи(PDF) 13 Page - Analog Devices

номер детали ADF4196BCPZ
подробное описание детали  Low Phase Noise, Fast Settling, 6 GHz
PDF  28 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
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ADF4196BCPZ датащи(HTML) 13 Page - Analog Devices

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Data Sheet
ADF4196
Rev. B | Page 13 of 28
DIFFERENTIAL AMPLIFIER
The internal, low noise, differential-to-single-ended amplifier
converts the differential charge pump output to a single-ended
control voltage for the tuning port of the VCO. Figure 26 shows
a simplified schematic of the differential amplifier. The output
voltage is equal to the differential voltage, offset by the voltage
on the CMR pin, according to the following equation:
VAOUT = (VAIN+ − VAIN−) + VCMR
(2)
The CMR offset voltage is internally biased to three-fifths of
VP3, the differential amplifier power supply voltage, as shown in
Figure 26. Connect a 0.1 µF capacitor to the ground plane from
the CMR pin to roll off the thermal noise of the biasing resistors.
AIN–
AOUT
AIN+
CMR
VP3
C EXT =
0.1µF
20kΩ
30kΩ
500Ω
500Ω
500Ω
500Ω
Figure 26. Differential Amplifier Block Diagram
As shown in Figure 15, the differential amplifier output voltage
behaves according to Equation 2 over a 4 V range from ~1.2 V
minimum up to VP3 − 0.3 V maximum. However, fast settling
is guaranteed over a tuning voltage range from 1.8 V up to
VP3 − 0.8 V only. This range allows sufficient room for overshoot
in the PLL frequency settling transient.
Noise from the differential amplifier is suppressed inside the
PLL loop bandwidth. For loop bandwidths of >20 kHz, the 1/f
noise has a negligible effect on the PLL output phase noise.
Outside the loop bandwidth, the FM noise of the differential
amplifier modulates the VCO. The passive filter network following
the differential amplifier (see Figure 37) suppresses this noise
contribution to below the VCO noise from offsets of 400 kHz
and greater. This network has a negligible effect on lock time
because it is bypassed when SW3 is closed while the loop is
locking.
MUXOUT AND LOCK DETECT
MUXOUT Control
The output multiplexer on the ADF4196 allows the user to
access various internal points on the chip. The state of MUXOUT
is controlled by Bits[M4:M1] in the mux register. Figure 35
shows the full truth table; see Figure 27 for a block diagram
of the MUXOUT circuit.
R DIVIDER OUTPUT
N DIVIDER OUTPUT
SERIAL DATA OUTPUT
DGND
DVDD
CONTROL
MUX
MUXOUT
LOGIC LOW
THREE-STATE OUTPUT
TIMER OUTPUTS
DIGITAL LOCK DETECT
LOGIC HIGH
NOTE:
1. NOT ALL MUXOUT MODES THAT ARE SHOWN REFER TO THE
MUX REGISTER.
Figure 27. MUXOUT Circuit
Lock Detect
MUXOUT can be programmed to provide a digital lock detect
signal. Digital lock detect is active high. Its output goes high if
there are 40 successive PFD cycles with an input error of <3 ns.
For reliable lock detect operation with RF frequencies of <2 GHz,
it is recommended that this threshold be increased to 10 ns by
programming Register R6. The digital lock detect goes low again
when a new channel is programmed or when the error at the
PFD input exceeds 30 ns for one or more cycles.
INPUT SHIFT REGISTER
The ADF4196 serial interface includes a 24-bit input shift register.
Data is clocked in, MSB first, on each rising edge of CLK. Data
from the shift register is latched into one of eight control registers,
R0 to R7, on the rising edge of load enable (LE) The destination
register is determined by the state of the three control bits: C3
(DB2), C2 (DB1), and C1 (DB0) in the shift register. DB2, DB1,
and DB0 are the three LSBs, as shown in the timing diagram
in Figure 2. The truth table for these bits is shown in Table 6.
Figure 28 shows a summary of how the registers are programmed.
Table 6. C3, C2, and C1 Truth Table
Control Bits
C3 (DB2)
C2 (DB1)
C1 (DB0)
Register Name
Register
0
0
0
FRAC/INT
R0
0
0
1
MOD/R
R1
0
1
0
Phase
R2
0
1
1
Function
R3
1
0
0
Charge pump
R4
1
0
1
Power-down
R5
1
1
0
Mux
R6
1
1
1
Test mode
R7



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