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PCM4104-EP

SBAS419 – JUNE 2007

High-Performance, 24-Bit, 216-kHz Sampling, Four-Channel Audio

Digital-to-Analog Converter

–

256 Steps with 0.5 dB per Step

• Controlled Baseline

• Output Phase Inversion (Software Mode Only)

–

One Assembly/Test Site, One Fabrication

• Zero Data Mute (Software Mode Only)

Site

• Audio Serial Port

• Extended Temperature Performance of –40°C

–

Supports Left-Justified, Right-Justified,

to 85

°C

• Enhanced Diminishing Manufacturing Sources

–

Accepts 16-, 18-, 20-, and 24-Bit Two's

(DMS) Support

Complement PCM Audio Data

• Enhanced Product-Change Notification

• Standalone or Software-Controlled

Configuration Modes

• Four High-Performance, Multi-Level,

• Four-Wire Serial Peripheral Interface (SPI™)

Delta-Sigma Digital-to-Analog Converters

Port Provides Control Register Access in

Software Mode

• Differential Voltage Outputs

• Power Supplies: 5 V Analog, 3.3 V Digital

–

• Power Dissipation

• Supports Sampling Frequencies up to 216 kHz

–

• Typical Dynamic Performance (24-Bit Data)

–

–

Dynamic Range (A-Weighted): 118 dB

–

–

THD+N: –100 dB

• Power-Down Modes

• Linear Phase, 8× Oversampling Digital

Interpolation Filter

• Small 48-Lead TQFP Package

• Digital De-Emphasis Filters for 32-kHz,

44.1-kHz, and 48-kHz Sampling Rates

• Digital Mixing Consoles

• Soft Mute Function

• Digital Audio Workstations

–

All-Channel Mute via the MUTE Input Pin

• Digital Audio Effects Processors

–

Per-Channel Mute Available in Software

• Broadcast Studio Equipment

Mode

• Surround-Sound Processors

• Digital Attenuation (Software Mode Only)

• High-End A/V Receivers

–

Attenuation Range: 0 dB to –119.5 dB

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.