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33899 датащи(PDF) 22 Page - Freescale Semiconductor, Inc |
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33899 датащи(HTML) 22 Page - Freescale Semiconductor, Inc |
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22 / 26 page ![]() Analog Integrated Circuit Device Data 22 Freescale Semiconductor 33899 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS LOGIC COMMANDS AND REGISTERS SPI INTERFACE AND REGISTER DESCRIPTION SPI Control Register Definition An 8-bit SPI allows the system microprocessor to clear the Fault register, select a programmable current limit, and select a 1X, 2X, or 4X slew rate. The SPI Control Register bit definitions are shown in Table 8. Note At POR, all bits in the register are cleared to 0s. SPI Fault Register Definition The fault diagnostic capability consists of one internal 8-bit Fault register. Table 9 shows the content of the Fault register. The output load status of the H-Bridge circuit is reported via the output DO SPI bits. In addition to output fault information, die temperature warnings and over-temperature conditions are reported. An SPI read cycle is limited by a CS logic [1] to logic [0] transition, followed by 8 SCLK cycles to shift the fault register bits out the DO pin. The rising edge of CS sets DO in a high- impedance mode and clears the fault latches if the FLTCLR bit is set. The thermal fault is immediately set again if the fault condition is still present. Accurate fault reporting can only be obtained by reading the DO line at intervals greater than the fault timer. A thermal fault will be latched as soon as it occurs. Note: At POR, all bits in the register are cleared to 0s. Table 8. SPI Control Register Bit Definitions 8 (MSB) 7 6 5 4 3 2 1 (LSB) FLTCLR Not Used Not Used Not Used Current Limit Current Limit Slew Time Slew Time Bit 8: FLTCLR: 0 = Retain faults; 1 = Clear faults Bit 7: Not used Bit 6: Not used Bit 5: Not used Bits 4–3: Set Low Side Current Comparator Limits 00 = 4.0A 01 = 5.0A 10 = 6.0A 11 = 8.5A Bits 2–1: Slew Time 00 = 1X 01 = 2X 10 = 4X 11 = 4X Table 9. SPI Fault Register Bit Definitions 8 (MSB) 765 43 2 1 (LSB) ShVIGNP ShGnd Open Fault Over-voltage or Under-voltage LS Comparator EN1, EN2 Status Die Temp Die Temp Bit 8: Short to VIGNP: 0 = No fault; 1 = S1 or S0 shorted to VIGNP (Low Side Linear Current Limit has tripped) Bit 7: Short to Ground: 0 = No fault; 1 = S1 or S0 shorted to GND (High Side Linear Current Limit has tripped) Bit 6: Open Fault: 0 = No fault; 1 = S1 or S0 is Open Circuited Bit 5: Over-voltage or Under-voltage: 0 = No fault; 1 = Over-voltage/under-voltage fault Bit 4: Low Side Comparator: 0 = No trip; 1 = Tripped Bit 3: XOR function of EN1, EN2 inputs. 0 = (EN1 same logic level as EN2). 1 = (EN1 not same logic level as EN2). Bits 2–1: Die Temperature 00 = T < 140 °C 01 = 140 °C < T < Over-temperature Shutdown 10 = Not Defined 11 = Over-temperature Shutdown (Latched Off) |
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