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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ATmega169P датащи(PDF) 267 Page - ATMEL Corporation |
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ATmega169P датащи(HTML) 267 Page - ATMEL Corporation |
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267 / 393 page  267 8018N–AVR–08/09 ATmega169P 25.5.5 Scanning the ADC Figure 25-9 shows a block diagram of the ADC with all relevant control and observe signals. The Boundary-scan cell from Figure 25-5 is attached to each of these signals. The ADC need not be used for pure connectivity testing, since all analog inputs are shared with a digital port pin as well. Figure 25-9. Analog to Digital Converter The signals are described briefly in Table 25-3. 10-bit DAC + - AREF PRECH DACOUT COMP MUXEN_7 ADC_7 MUXEN_6 ADC_6 MUXEN_5 ADC_5 MUXEN_4 ADC_4 MUXEN_3 ADC_3 MUXEN_2 ADC_2 MUXEN_1 ADC_1 MUXEN_0 ADC_0 NEGSEL_2 ADC_2 NEGSEL_1 ADC_1 NEGSEL_0 ADC_0 EXTCH + - 1x ST ACLK AMPEN 1.11V ref IREFEN AREF VCCREN DAC_9..0 ADCEN HOLD PRECH GNDEN PASSEN COMP SCTEST ADCBGEN To Comparator 1.22V ref ACTEN AREF |
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