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ADIS16265/PCBZ датащи(PDF) 16 Page - Analog Devices |
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ADIS16265/PCBZ датащи(HTML) 16 Page - Analog Devices |
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16 / 19 page ![]() ADIS16260/ADIS16265 Rev. PrB | Page 16 of 19 STATUS AND DIAGNOSTICS The ADIS16260/ADIS16265 provide a number of status and diagnostic functions. Table 25 provides a summary of these functions, along with their appropriate control registers. Table 25. Status and Diagnostic Functions Function Register Data-ready I/O indicator MSC_CTRL Self-test, mechanical check for MEMS sensor MSC_CTRL Status, check for predefined error conditions STATUS Flash memory endurance ENDURANCE Alarms, configure and check for user-specific conditions ALM_MAG1/2 ALM_SMPL1/2 ALM_CTRL Data-Ready I/O Indicator The data-ready function provides an indication of updated output data. The MSC_CTRL register provides the opportunity to configure either of the general-purpose I/O pins (DIO0 and DIO1) as a data-ready indicator signal. After each output register update, the digital I/O changes states, then returns to its original state, creating a pulsed waveform. The duty cycle of that waveform is in between 15% and 35%. Table 26. MSC_CTRL Register Definition Address Default Format Access 0x35, 0x34 0x0000 N/A R/W Table 27. MSC_CTRL Bit Descriptions Bit Description 15:11 Not used 10 Internal self-test enable 1 = enabled 0 = disabled 9 External negative rotation self-test enable 1 = enabled 0 = disabled 8 External positive rotation self-test enable 1 = enabled 0 = disabled 7:3 Not used 2 Data-ready enable 1 = enabled 0 = disabled 1 Data-ready polarity 1 = active high 0 = active low 0 Data-ready line select 1 = DIO1 0 = DIO0 Self-Test The MSC_CTRL register also provides a self-test function, which verifies the MEMS sensor’s mechanical integrity. There are two different self-test options: (1) internal self-test and (2) external self-test. The internal test provides a simple, two-step process for checking the MEMS sensor: (1) start the process by writing a 1 to Bit 10 in the MSC_CTRL register and (2) check the result by reading Bit 5 of the STATUS register, after 35 ms. The external self-test is a static condition that can be enabled and disabled. In this test, both positive and negative MEMS sensor movements are available. After writing to the appropriate control bit, the GYRO_OUT register reflects the changes after a delay that reflects the sensor signal chain response time. For example, the standard 52 Hz bandwidth reflects an exponential response with a time constant of 3.2 ms. If the bandwidth is reduced externally (capacitor across RATE and FILT) or internally (increasing the number of filter taps, SENS/AVG), this time constant increases. For the internal self-test option, increasing the delay can produce false alarms, since the internal timing for this function is optimized for maximum bandwidth. The appropriate bit definitions for self-test are listed in Table 26 and Table 27. Status Conditions The STATUS register contains the following error-condition flags: Alarm conditions, self-test status, angular rate over range, SPI communication failure, control register update failure, and power supply out of range. See Table 28 and Table 29 for the appropriate register access and bit assignment for each flag. The bits assigned for checking power supply range and angular rate over range automatically reset to 0 when the error condition no longer exists. The remaining error-flag bits in the STATUS register require a read in order to return them to 0. Note that a STATUS register read clears all of the bits to 0. Table 28. STATUS Register Definition Address Default Format Access 0x3D, 0x3C 0x0000 N/A Read-only Table 29. STATUS Bit Descriptions Bit Description 15:10 Not used 9 Alarm 2 status 1 = active, 0 = inactive 8 Alarm 1 status 1 = active, 0 = inactive 7:6 Not used 5 Self-test diagnostic error flag 1 = error condition, 0 = normal operation 4 Angular rate over range 1 = error condition, 0 = normal operation 3 SPI communications failure 1 = error condition, 0 = normal operation 2 Control register update failed 1 = error condition, 0 = normal operation 1 Power supply above 5.25 V 1 = above 5.25 V, 0 = below 5.25 V (normal) 0 Power supply below 4.75 V 1 = below 4.75 V, 0 = above 4.75 V (normal) |
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