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THS6214IPWPR датащи(PDF) 2 Page - Texas Instruments |
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THS6214IPWPR датащи(HTML) 2 Page - Texas Instruments |
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2 / 41 page ![]() ABSOLUTE MAXIMUM RATINGS (1) DISSIPATION RATINGS THS6214 SBOS431 – MAY 2009 ....................................................................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) SPECIFIED PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE-LEAD(2) DESIGNATOR RANGE MARKING NUMBER MEDIA, QUANTITY THS6214IRHFT Tape and reel, 250 THS6214 QFN-24 RHF –40°C to +85°C 6214 THS6214IRHFR Tape and reel, 3000 THS6214IPWP Tape and reel, 60 THS6214 TSSOP-24 PWP –40°C to +85°C THS6214 THS6214IPWPR Tape and reel, 2000 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) The PowerPAD™ is electrically isolated from all other pins. Over operating free-air temperature range, unless otherwise noted. THS6214 UNIT Supply voltage, VS– to VS+ 28 V Input voltage, VI ±VS V Differential input voltage, VID ±2 V Output current, IO: Static dc (2) ±500 mA Continuous power dissipation See Dissipation Ratings Table Under any condition(3) +150 °C Continuous operation, long-term reliability(4) Maximum junction +130 °C RHF package only temperature, TJ Continuous operation, long-term reliability(4) +140 °C PWP package only Storage temperature range, TSTG –65 to +150 °C Human body model (HBM) 2000 V ESD ratings Charged device model (CDM) 500 V Machine model (MM) 100 V (1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute maximum rated conditions for extended periods may degrade device reliability. (2) The THS6214 incorporates a PowerPAD on the underside of the chip. This pad acts as a heatsink and must be connected to a thermally dissipating plane for proper power dissipation. Failure to do so may result in exceeding the maximum junction temperature, which could permanently damage the device. See TI Technical Brief SLMA002 for more information about utilizing the PowerPAD thermally-enhanced package. Under high-frequency ac operation (greater than 10kHz), the short-term output current capability is much greater than the continuous dc output current rating. This short-term output current rating is about 8.5 times the dc capability, or about ±850mA. (3) The absolute maximum junction temperature under any condition is limited by the constraints of the silicon process. (4) The absolute maximum junction temperature for continuous operation is limited by the package constraints. Operation above this temperature may result in reduced reliability and/or lifetime of the device. PACKAGE θ JP (°C/W) θ JA (°C/W) (1) QFN-24 (RHF) 5 30 HTSSOP-24 (PWP) 7 45 (1) For high power dissipation applications, soldering the PowerPAD to the PCB is required. Failure to do so may result in reduced reliability and/or lifetime of the device. See TI technical brief SLMA002 for more information about using the PowerPAD thermally enhanced package. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): THS6214 |
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