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SN54ALS165FK датащи(PDF) 3 Page - Texas Instruments

номер детали SN54ALS165FK
подробное описание детали  PARALLEL-LOAD 8-BIT REGISTERS
PDF  7 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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SN54ALS165FK датащи(HTML) 3 Page - Texas Instruments

  SN54ALS165FK Datasheet HTML 1Page - Texas Instruments SN54ALS165FK Datasheet HTML 2Page - Texas Instruments SN54ALS165FK Datasheet HTML 3Page - Texas Instruments SN54ALS165FK Datasheet HTML 4Page - Texas Instruments SN54ALS165FK Datasheet HTML 5Page - Texas Instruments SN54ALS165FK Datasheet HTML 6Page - Texas Instruments SN54ALS165FK Datasheet HTML 7Page - Texas Instruments  
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SN54ALS165, SN74ALS165
PARALLEL-LOAD 8-BIT REGISTERS
SDAS157B – JUNE 1982 – REVISED DECEMBER 1994
3
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
typical shift, load, and inhibit sequences
Load
E
QH
H
G
C
F
Data
Inputs
D
SH/LD
SER
CLK INH
CLK
B
A
QH
L
L
H
L
H
L
H
H
H
H
L
H
L
H
L
H
L
H
L
L
H
L
H
L
H
Inhibit
Serial Shift
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN54ALS165
– 55
°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ALS165
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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