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THS8136IPHPR датащи(PDF) 11 Page - Texas Instruments |
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THS8136IPHPR датащи(HTML) 11 Page - Texas Instruments |
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11 / 17 page ![]() ANALOG (DAC) OUTPUTS ELECTRICAL CHARACTERISTICS THS8136 www.ti.com ........................................................................................................................................................................................... SLES236 – NOVEMBER 2008 over recommended operating conditions, fCLK = 180 MHz, use of internal reference voltage VREF, RFS = RFS(nom), 37.5- Ω load termination (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DAC resolution 10 Bits Static, best fit, RGB with sync insertion (700 + -1/1 –2.5/1.5 sync) INL Integral nonlinearity LSB Static, best fit, generic mode, 1.2 V output range –1/1 Static, RGB with sync insertion (700 + sync) –0.4/0.4 ±1 DNL Differential nonlinearity LSB Static, generic mode, 1.2 V output range -0.4/0.4 Power supply ripple rejection ratio of PSRR f = DC(1) 38.5 dB DAC output (full scale) Vrefo Voltage reference output 1.12 1.16 1.20 V RR VREF output resistance 284 Ω KIMBAL Imbalance between DACs(2) CLK = 80 MSPS, video mode –2 1.8 2 % VOC DAC output compliance voltage 0.7 1.2 V Generic DAC mode CLK = 80 MSPS(3) 18 18.67 19.5 IFS mA RGB with sync insertion enabled CLK = 80 MSPS(3) 27 28 29.3 tRDAC DAC output current rise time CLK = 80 MSPS, 10 to 90% of full scale(4) 2.8 3.3 3.6 ns tFDAC DAC output current fall time CLK = 80 MSPS, 10 to 90% of full scale(4) 2.8 3.3 3.6 ns Measured from CLK = VIH(min) to 50% of td(A) Analog output delay 4.5 ns full-scale transition(5) Measured from 50% of full scale transition on tS Analog output settling time 15 ns output to output settling, within 2%(4) (1) PSRR is measured with a 0.1- µF capacitor between the COMP and AV DD pins and with a 0.1-µF capacitor connected between the VREF and AVSS pins. The ripple amplitude is within the range 100 mVp-p to 500 mVp-p with the DAC output set to full scale and a double-terminated 75 Ω (= 37.5 Ω) load. PSRR is defined as 20 × log(ripple voltage at DAC output/ripple voltage at AVDD input). Limits are from characterization only. (2) The imbalance between DACs applies to all possible pairs of the three DACs. (3) Values at RFS = RFS(nom) (4) From characterization only. Measured on the AG channel with RFS = RFS(nom). (5) This value excludes the digital process delay, tD(D). Limit are from characterization only. Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Link(s): THS8136 |
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