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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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H8S2245 датащи(PDF) 584 Page - Renesas Technology Corp |
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H8S2245 датащи(HTML) 584 Page - Renesas Technology Corp |
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584 / 818 page  Section 16 ROM Rev.3.00 Mar. 26, 2007 Page 542 of 772 REJ09B0355-0300 16.5.4 Reliability of Programmed Data An effective way to assure the data retention characteristics of the programmed chips is to bake them at 150°C, then screen them for data errors. This procedure quickly eliminates chips with PROM cells prone to early failure. Figure 16.6 shows the recommended screening procedure. Mount Program chip and verify data Bake chip for 24 to 48 hours at 125 °C to 150°C with power off Read and check program Figure 16.6 Recommended Screening Procedure If a series of programming errors occurs while the same PROM programmer is being used, stop programming and check the PROM programmer and socket adapter for defects. Please inform Renesas of any abnormal conditions noted during or after programming or in screening of program data after high-temperature baking. |
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