DCBOOST/ENA_HS

D2P

D2M

SCL/CD

VCC

SDA

D1P

D1N

100 nF

100 nF

REQ

+3.3 V

100 nF

1 PF

+3.3 V

RDC1

RDC2

USB

Host or Hub

USB_DP

USB_DN

USB_DP

USB_DN

Copyright © 2017, Texas Instruments Incorporated

12

TUSB212

SLLSEX5A – AUGUST 2017 – REVISED SEPTEMBER 2017

www.ti.com

Product Folder Links: TUSB212

Submit Documentation Feedback

Copyright © 2017, Texas Instruments Incorporated

D2P must be shorted to D1P on PCB.

D2N must be shorted to D1N on PCB.

Figure 7. Reference Schematic

8.2.2.1 Test Procedure to Construct USB High Speed Eye Diagram

NOTE

USB-IF certification tests for High Speed eye masks require the mandated use of the

USB-IF developed test fixtures. These test fixtures do not require the use of oscilloscope

probes. Instead they use SMA cables. More information can be found at the USB-IF

Compliance Updates Page. It is located under the ‘Electricals’ section, ID 86 dated March

2013.

The following procedure must be followed before using any oscilloscope compliance software to construct a USB

High Speed Eye Mask:

8.2.2.1.1

For a Host Side Application

1. Configure the TUSB212 to the desired AC and DC boost settings.

2. Power on (or toggle the RSTN pin if already powered on) the TUSB212

3. Using SMA cables, connect the oscilloscope and the USB-IF host-side test fixture to the TUSB212

4. Enable the host to transmit USB TEST_PACKET

5. Execute the oscilloscope USB compliance software.

6. Repeat the above steps in order to re-test TUSB212 with different AC and DC boost settings.