OPA2192IDRG4 datasheet(21/61 Pages) TI2

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Temperature (qC)

Offset Voltage vs Temperature

-50

-25

100

125

150

-100

-75

-50

-25

100

Temperature

VOS Before e-trim

VOS After e-trim

Linear component of drift

OPA192, OPA2192, OPA4192

www.ti.com

SBOS620E – DECEMBER 2013 – REVISED NOVEMBER 2015

7 Parameter Measurement Information

7.1 Input Offset Voltage Drift

The OPAx192 family of operational amplifiers is manufactured using TI’s e-trim technology. Each amplifier input

offset voltage and input offset voltage drift is trimmed in production, thereby minimizing errors associated with

input offset voltage and input offset voltage drift. The e-trim technology is a TI proprietary method of trimming

internal device parameters during either wafer probing or final testing. When trimming input offset voltage drift the

systematic or linear drift error on each device is trimmed to zero. This results in the remaining errors associated

with input offset drift are minimal and are the result from only nonlinear error sources. Figure 49 illustrates this

concept.

Figure 49. Input Offset Before and After Drift Trim

A common method of specifying input offset voltage drift is the box method. The box method estimates a

maximum input offset drift by bounding the offset voltage versus temperature curve with a box and using the

corners of this bounding box to determine the drift. The slope of the line connecting the diagonal corners of the

box corresponds to the input offset voltage drift. Figure 50 shows the box method concept. The box method

works particularly well when the input offset drift is dominated by the linear component of drift, but because the

OPA192 family uses TI’s e-trim technology to remove the linear component input offset voltage drift, the box

method is not a particularly useful method of accurately performing an error analysis. Figure 50 shows 30 typical

units of the OPAx192 with the box method superimposed for illustrative purposes. The boundaries of the box are

determined by the specified temperature range along the x-axis and the maximum specified input offset voltage

across that same temperature range along the y-axis. Using the box method predicts an input offset voltage drift

of 0.9 µV/°C. As shown in Figure 50, the slopes of the actual input offset voltage versus temperature are much

less than that predicted by the box method. The box method predicts a pessimistic value for the maximum input

offset voltage drift and is not recommended when performing an error analysis.

Figure 50. The Box Method

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