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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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L9300 датащи(PDF) 157 Page - STMicroelectronics |
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L9300 датащи(HTML) 157 Page - STMicroelectronics |
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157 / 178 page  Figure 68. Analog trimming mask concept GADG2707170800PS Diagnostic comparators The off-state diagnostic comparators have analog self test implemented to detect latent faults. Self test structure is shown in the next figure and it can be enabled through dedicated SPI bit, independent of each channel, only if the off state diagnostic is kept disabled. Once triggered, the self test is kept active until SPI bit removal or until enable of off state diagnostic; if analog self test fails a warning flag is set in the Exception registers, while off state diagnostic output is masked. Figure 69. Diagnostic analog self test basic implementation L9300 Functional safety DS12258 - Rev 5 page 157/178 |
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