PLL1705

PLL1706

SLES046A − AUGUST 2002 − REVISED SEPTEMBER 2002

www.ti.com

2

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate

precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to

damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION

PRODUCT

PACKAGE

PACKAGE CODE

OPERATION

TEMPERATURE

RANGE

PACKAGE

MARKING

ORDERING

NUMBER

TRANSPORT

MEDIA

PLL1705DBQ

SSOP 20

20DBQ

−25

°C to 85°C

PLL1705

PLL1705DBQ

Tube

PLL1705DBQ

SSOP 20

20DBQ

−25

°C to 85°C

PLL1705

PLL1705DBQR

Tape and reel

PLL1706DBQ

SSOP 20

20DBQ

−25

°C to 85°C

PLL1706

PLL1706DBQ

Tube

PLL1706DBQ

SSOP 20

20DBQ

−25

°C to 85°C

PLL1706

PLL1706DBQR

Tape and reel

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)

PLL1705 AND PLL1706

Supply voltage: VCC, VDD1–3

4 V

Supply voltage differences: VCC, VDD1–3

±0.1 V

Ground voltage differences: AGND, DGND1–3

±0.1 V

Digital input voltage: FS1 (MD), FS2 (MC), SR (ML), CSEL

– 0.3 V to (VDD + 0.3) V

Analog input voltage, XT1, XT2

– 0.3 V to (VCC + 0.3) V

Input current (any pins except supplies)

±10 mA

Ambient temperature under bias

–40

°C to 125°C

Storage temperature

–55

°C to 150°C

Junction temperature

150

°C

Lead temperature (soldering)

260

°C, 5 s

Package temperature (IR reflow, peak)

260

°C

(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.