PCM1602A

SLES146A – AUGUST 2005 – REVISED OCTOBER 2010

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

VDD

–0.3 V to 4 V

Power supply voltage

VCC

–0.3 V to 6.5 V

VCC, VDD

Supply voltage difference

VCC – VDD < 3 V

Ground voltage differences

±0.1 V

Digital input voltage

–0.3 V to 6.5 V

Input current (except power supply pins)

±10 mA

Operating temperature under bias

–40°C to 125°C

Storage temperature

–55°C to 150°C

Junction temperature

150°C

Package temperature (reflow, peak)

260°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

RECOMMENDED OPERATING CONDITIONS

Over operating free-air temperature range.

MIN

NOM

MAX

UNIT

Digital supply voltage, VDD

3

3.3

3.6

V

Analog supply voltage, VCC

4.5

5

5.5

V

Digital input logic family

TTL

System clock

8.192

36.864

MHz

Digital input clock frequency

Sampling clock, VOUT1, VOUT2

32

192

kHz

Sampling clock, VOUT3, VOUT4, VOUT5, VOUT6

32

96

Analog output load resistance

5

k

Ω

Analog output load capacitance

50

pF

Digital output load capacitance

20

pF

Operating free-air temperature, TA

–25

85

°C

2

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