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LP8720 датащи(PDF) 16 Page - Texas Instruments |
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LP8720 датащи(HTML) 16 Page - Texas Instruments |
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16 / 26 page ![]() LP8720 SNVS575B – JULY 2008 – REVISED MAY 2013 www.ti.com D-Type and LO-Type LDO Electrical Characteristics (continued) Unless otherwise noted, VVBATT = VVINB = VVIN1 = VVIN2 = 3.6V, GND = GNDB = 0V, CVBATT = CVIN1 = CVIN2 = 2.2 µF, CVINB = 10 µF. Typical values and limits appearing in normal type apply for TJ = 25°C. Limits appearing in boldface type apply over the entire junction temperature range for operation, TJ= -40 to +125°C (1) Limit Parameter Test Conditions LDO# Typ Units Min Max PSRR Power Supply Ripple f =10 kHz, COUT = 1 µF, IOUT = 20 1,4,5 55 dB Rejection Ratio mA(3) tstartup Startup Time from Shutdown COUT = 1 µF, IOUT = IMAX (3) 1,4,5 35 µs VTransient Startup Transient Overshoot COUT = 1µF, IOUT = IMAX (3) 1,4,5 30 mV COUT External output capacitance 1,4,5 1.0 0.5 20 µF for stability Serial Interface Unless otherwise noted, VVBATT = VVINB = VVIN1 = VVIN2 = 3.6V, GND = GNDB = 0V, CVBATT = CVIN1 = CVIN2 = 2.2 µF, CVINB = 10 µF. Typical values and limits appearing in normal type apply for TJ= 25°C. Limits appearing in boldface type apply over the entire junction temperature range for operation, TJ= -40 to +125°C (1) (2) Limit Unit Parameter Test Conditions Typ s Min Max fCLK Clock Frequency 400 kHz tBF Bus-Free Time between START and STOP 1.3 µs tHOLD Hold Time Repeated START Condition 0.6 µs tCLK-LP CLK Low Period 1.3 µs tCLK-HP CLK High Period 0.6 µs tSU Set-Up Time Repeated START Condition 0.6 µs tDATA-HOLD Data Hold Time 50 ns tDATA-SU Data Set-Up Time 100 ns tSU Set-Up Time for STOP Condition 0.6 µs tTRANS Maximum Pulse Width of Spikes that Must Be Suppressed by 50 ns the Input Filter of Both DATA and CLK Signals (1) All limits are specified. All electrical characteristics having room-temperature limits are tested during production with TJ = 25°C. All hot and cold limits are ensured by correlating the electrical characteristics to process and temperature variations and applying statistical process control. (2) Ensured by design. 16 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: LP8720 |
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