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ST7GEME4 датащи(PDF) 23 Page - STMicroelectronics |
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ST7GEME4 датащи(HTML) 23 Page - STMicroelectronics |
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23 / 28 page ![]() ST7GEME4 Electrical characteristics 23/28 4.7.3 Absolute maximum ratings (electrical sensitivity) Based on three different tests (ESD, LU and DLU) using specific measurement methods, the product is stressed in order to determine its performance in terms of electrical sensitivity. For more details, refer to the application note AN1181. Electrostatic discharge (ESD) Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). The Human Body Model is simulated. This test conforms to the JESD22-A114A standard. Static and dynamic latch-up ● LU: 3 complementary static tests are required on 10 parts to assess the latch-up performance. A supply overvoltage (applied to each power supply pin) and a current injection (applied to each input, output and configurable I/O pin) are performed on each sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the application note AN1181. ● DLU: Electrostatic discharges (one positive then one negative test) are applied to each pin of 3 samples when the micro is running to assess the latch-up performance in dynamic mode. Power supplies are set to the typical values, the oscillator is connected as near as possible to the pins of the micro and the component is put in reset mode. This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details, refer to the application note AN1181. Table 21. Absolute maximum ratings Symbol Ratings Conditions Maximum value(1) 1. Data based on characterization results, not tested in production. Unit VESD(HBM) Electrostatic discharge voltage (Human Body Model) TA=+25 °C 2000 V Table 22. Electrical sensitivities Symbol Parameter Conditions Class(1) 1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the JEDEC criteria (international standard). LU Static latch-up class TA=+25 °C A DLU Dynamic latch-up class VDD=5.5 V, fOSC=4MHz, TA=+25 °C A |
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