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ST7GEME4 датащи(PDF) 22 Page - STMicroelectronics

номер детали ST7GEME4
подробное описание детали  Full-speed USB MCU with smartcard firmware and EMV/non-EMV interface
PDF  28 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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Electrical characteristics
ST7GEME4
22/28
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
4.7.2
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 19.
EMS characteristics
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD=5V, TA=+25 °C, fOSC=8MHz
conforms to IEC 1000-4-2
2B
VFFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VDD pins
to induce a functional disturbance
VDD=5V, TA=+25 °C, fOSC=8MHz
conforms to IEC 1000-4-4
4B
Table 20.
EMI characteristics
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fOSC/fCPU]
(1)
1.
Data based on characterization results, not tested in production.
Unit
4/8MHz 4/4MHz
SEMI
Peak level
VDD=5V, TA=+25 °C,
conforming to SAE J 1752/3
0.1 MHz to
30 MHz
19
18
dB
µ
V
30 MHz to
130 MHz
32
27
130 MHz to
1GHz
31
26
SAE EMI Level
4
3.5
-



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