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SST29SF040 датащи(PDF) 15 Page - Silicon Storage Technology, Inc

номер детали SST29SF040
подробное описание детали  4 Mbit (x8) Small-Sector Flash
PDF  22 Pages
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производитель  SST [Silicon Storage Technology, Inc]
домашняя страница  http://www.sst.com/
Logo SST - Silicon Storage Technology, Inc

SST29SF040 датащи(HTML) 15 Page - Silicon Storage Technology, Inc

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Data Sheet
4 Mbit Small-Sector Flash
SST29SF040 / SST29VF040
15
©2004 Silicon Storage Technology, Inc.
S71160-10-000
2/04
FIGURE 12: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29SF040
FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29VF040
FIGURE 14: TEST LOAD EXAMPLES
1160 F12.0
REFERENCE POINTS
OUTPUT
INPUT
VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (3.0 V) for a logic “1” and VILT (0 V) for a logic “0”. Measurement reference points for
inputs and outputs are VIT (1.5 V) and VOT (1.5 V). Input rise and fall times (10%
↔90%) are <10 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
1160 F12.0
REFERENCE POINTS
OUTPUT
INPUT
VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10%
↔90%) are <5 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
1160 F14b.0
TO TESTER
TO DUT
CL
SST29VF040
1160 F14a.0
SST29SF040
TO TESTER
TO DUT
CL
RL LOW
RL HIGH
VDD



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