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SL1ICS3101 датащи(PDF) 12 Page - NXP Semiconductors |
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SL1ICS3101 датащи(HTML) 12 Page - NXP Semiconductors |
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12 / 22 page ![]() Product Specification SL1 ICS31 01 Rev. 1.2 July 2000 Page 12 of 22 Public 9 Quality Assurance 9.1 Electrical Acceptance Test The electrical acceptance test is performed in line (‘sampling on the fly’) according to the test specifications. Sampling plan: according General Quality Specification 9.2 Visual Inspection 9.2.1 After Wafer Final Test Performed according document SNW-FQ-627. Sampling plan: according General Quality Specification 9.2.2 After Sawing (Film Frame Carrier) Performed according document PICTOH-QS007. Sampling plan (3 wafers per lot): accept 0/3 |
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