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ST10F276 датащи(PDF) 185 Page - STMicroelectronics

номер детали ST10F276
подробное описание детали  16-bit MCU with MAC unit, 832 Kbyte Flash memory and 68 Kbyte RAM
PDF  229 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
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ST10F276 датащи(HTML) 185 Page - STMicroelectronics

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ST10F276
Electrical characteristics
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23.7
A/D converter characteristics
VDD = 5V ± 10%, VSS = 0V, TA = –40 to +125°C, 4.5V ≤ VAREF ≤ VDD,
VSS ≤ VAGND ≤ VSS + 0.2V
Table 93. A/D converter characteristics
Symbol
Parameter
Test condition
Limit values
Unit
Min.
Max.
VAREFSR
Analog reference voltage(1)
1.
VAREF can be tied to ground when A/D converter is not in use: An extra consumption (around 200µA) on
main VDD is added due to internal analog circuitry not completely turned off. Therefore, it is suggested to
maintain the VAREF at VDD level even when not in use, and eventually switch off the A/D converter
circuitry setting bit ADOFF in ADCON register.
4.5
VDD
V
VAGNDSR
Analog ground voltage
VSS
VSS + 0.2
V
VAIN SR
Analog Input voltage(2)
2.
VAIN may exceed VAGND or VAREF up to the absolute maximum ratings. However, the conversion result in
these cases will be 0x000H or 0x3FFH, respectively.
VAGND
VAREF
V
IAREFCC
Reference supply current
Running mode
(3)Power Down mode
3.
Not 100% tested, guaranteed by design characterization.
–
–
5
1
mA
µA
tS
CC
Sample time
(4)
4.
During the sample time, the input capacitance CAIN can be charged/discharged by the external source.
The internal resistance of the analog source must allow the capacitance to reach its final voltage level
within
t
S. After the end of the sample time tS, changes of the analog input voltage have no effect on the
conversion result.
Values for the sample clock tS depend on programming and can be taken from Table 94.
1–
µs
tC
CC
Conversion time
(5)
5.
This parameter includes the sample time tS, the time for determining the digital result and the time to load
the result register with the conversion result. Values for the conversion clock tCC depend on programming
and can be taken from next Table 94.
3–
µs
DNL
CC
Differential nonlinearity(6)
No overload
–1
+1
LSB
INL
CC
Integral nonlinearity (6)
No overload
–1.5
+1.5
LSB
OFS
CC
Offset error (6)
No overload
–1.5
+1.5
LSB
TUE
CC
Total unadjusted error(6)
Port5
Port1 - No
overload(3)
Port1 - Overload(3)
–2.0
–5.0
–7.0
+2.0
+5.0
+7.0
LSB
LSB
LSB
K
CC
Coupling factor between
inputs(3) (7)
On both Port5 and
Port1
–10–6
–
CP1 CC
Input pin capacitance(3) (8)
–3
pF
CP2 CC
Port5
Port1
–
4
6
pF
pF
CS
CC
Sampling capacitance(3)(8)
–3.5
pF
RSW CC
Analog switch resistance (3)
(8)
Port5
Port1
–
–
600
1600
W
W
RAD CC
–1300
W



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