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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M58BW16F датащи(PDF) 44 Page - STMicroelectronics |
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M58BW16F датащи(HTML) 44 Page - STMicroelectronics |
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44 / 81 page  Maximum rating M58BW16F, M58BW32F 44/81 6 Maximum rating Stressing the device above the ratings listed in Table 14: Absolute maximum ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 14. Absolute maximum ratings Symbol Parameter Value Unit Min Max TBIAS Temperature Under Bias –40 125 °C TSTG Storage Temperature –55 155 °C VIO Input or Output Voltage –0.6 VDDQ +0.6 VDDQIN +0.6 V VDD, VDDQ, VDDQIN Supply Voltage –0.6 4.2 V |
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