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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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DSPIC30F датащи(PDF) 176 Page - Microchip Technology |
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DSPIC30F датащи(HTML) 176 Page - Microchip Technology |
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176 / 220 page  dsPIC30F5011/5013 DS70116C-page 174 Preliminary 2004 Microchip Technology Inc. TABLE 23-6: DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS DC CHARACTERISTICS Standard Operating Conditions: 2.5V to 5.5V (unless otherwise stated) Operating temperature -40°C ≤ TA ≤ +85°C for Industrial -40°C ≤ TA ≤ +125°C for Extended Param No. Symbol Characteristic Min Typ(1) Max Units Conditions VIL Input Low Voltage(2) DI10 I/O pins: with Schmitt Trigger buffer VSS —0.2 VDD V DI15 MCLR VSS —0.2 VDD V DI16 OSC1 (in XT, HS and LP modes) VSS —0.2 VDD V DI17 OSC1 (in RC mode)(3) VSS —0.3 VDD V DI18 SDA, SCL TBD — TBD V SM bus disabled DI19 SDA, SCL TBD — TBD V SM bus enabled VIH Input High Voltage(2) DI20 I/O pins: with Schmitt Trigger buffer 0.8 VDD —VDD V DI25 MCLR 0.8 VDD —VDD V DI26 OSC1 (in XT, HS and LP modes) 0.7 VDD —VDD V DI27 OSC1 (in RC mode)(3) 0.9 VDD —VDD V DI28 SDA, SCL TBD — TBD V SM bus disabled DI29 SDA, SCL TBD — TBD V SM bus enabled ICNPU CNXX Pull-up Current(2) DI30 50 250 400 µAVDD = 5V, VPIN = VSS DI31 TBD TBD TBD µAVDD = 3V, VPIN = VSS IIL Input Leakage Current(2)(4)(5) DI50 I/O ports — 0.01 ±1 µAVSS ≤ VPIN ≤ VDD, Pin at hi-impedance DI51 Analog input pins — 0.50 — µAVSS ≤ VPIN ≤ VDD, Pin at hi-impedance DI55 MCLR —0.05 ±5 µAVSS ≤ VPIN ≤ VDD DI56 OSC1 — 0.05 ±5 µAVSS ≤ VPIN ≤ VDD, XT, HS and LP Osc mode Note 1: Data in “Typ” column is at 5V, 25°C unless otherwise stated. Parameters are for design guidance only and are not tested. 2: These parameters are characterized but not tested in manufacturing. 3: In RC oscillator configuration, the OSC1/CLKl pin is a Schmitt Trigger input. It is not recommended that the dsPIC30F device be driven with an external clock while in RC mode. 4: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified levels represent normal operating conditions. Higher leakage current may be measured at different input voltages. 5: Negative current is defined as current sourced by the pin. |
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