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S12SCIV3/D датащи(PDF) 45 Page - NXP Semiconductors

номер детали S12SCIV3/D
подробное описание детали  The SoC Guide provides information about the MC9S12KG128 device made up of standard HCS12 blocks and the HCS12 processor core
PDF  98 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
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MC9S12KG128 SoC Guide — V01.01
execution, the system will be configured as described below unless the reset states of internal control
registers have been changed through background commands after the MCU was reset.
There is no external expansion bus after reset in this mode. Ports A and B are initially simple bidirectional
I/O pins that are configured as high-impedance inputs with internal pull-ups disabled; however, writing to
the mode select bits in the MODE register (which is allowed in special modes) can change this after reset.
All of the Port E pins (except PE4/ECLK) are initially configured as general purpose high-impedance
inputs with pull-ups enabled. PE4/ECLK is configured as the ECLK output in this mode.
The pins associated with Port E bits 6, 5, 3, and 2 cannot be configured for their alternate functions IPIPE1,
IPIPE0, LSTRB, and R/W while the MCU is in single chip modes In single chip modes, the associated
control bits PIPOE, LSTRE and RDWE are reset to zero. Writing the opposite value into these bits in
single chip mode does not change the operation of the associated Port E pins.
Port E, bit 4 can be configured for a free-running ECLK output by clearing NECLK=0. Typically the only
use for an ECLK output while the MCU is in single chip modes would be to get a constant speed clock for
use in the external application system.
4.2.2.2 Special Test Mode
In expanded wide modes, Ports A and B are configured as a 16-bit multiplexed address and data bus and
Port E provides bus control and status signals. In special test mode, the write protection of many control
bits is lifted so that they can be thoroughly tested without needing to go through reset.
4.2.2.3 Special Peripheral Mode
This mode is intended for Freescale factory testing of the MCU. In this mode, the CPU is inactive and an
external (tester) bus master drives address, data and bus control signals in through Ports A, B and E. In
effect, the whole MCU acts as if it was a peripheral under control of an external CPU. This allows faster
testing of on-chip memory and peripherals than previous testing methods. Since the mode control register
is not accessible in peripheral mode, the only way to change to another mode is to reset the MCU into a
different mode. Background debugging should not be used while the MCU is in special peripheral mode
as internal bus conflicts between BDM and the external master can cause improper operation of both
functions.
4.3 Internal Visibility
Internal visibility is available when the MCU is operating in expanded wide modes or special test modes.
It is not available in single-chip, peripheral or normal expanded narrow modes. Internal visibility is
enabled by setting the IVIS bit in the MODE register.
If an internal access is made while the ECLK, R/W, and LSTRB are configured as bus control outputs and
internal visibility is off (IVIS=0), ECLK will remain low for the cycle, R/W will remain high, and address,
data and the LSTRB pins will remain at their previous state.
When internal visibility is enabled (IVIS=1), certain internal cycles will be blocked from going external.
During cycles when the BDM is selected, R/W will remain high, data will maintain its previous state, and
address and LSTRB pins will be updated with the internal value. During CPU no access cycles when the
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com



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