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P89C51RB2BA датащи(PDF) 32 Page - NXP Semiconductors |
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P89C51RB2BA датащи(HTML) 32 Page - NXP Semiconductors |
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32 / 52 page ![]() Philips Semiconductors Preliminary specification 89C51RB2/89C51RC2/ 89C51RD2 80C51 8-bit Flash microcontroller family 16KB/32KB/64KB ISP/IAP Flash with 512B/512B/1KB RAM 1999 Sep 23 32 DC ELECTRICAL CHARACTERISTICS Tamb = 0°C to +70°C or –40°C to +85°C; 5 V ±10%; VSS = 0 V SYMBOL PARAMETER TEST LIMITS UNIT SYMBOL PARAMETER CONDITIONS MIN TYP1 MAX UNIT VIL Input low voltage 4.5 V < VCC < 5.5 V –0.5 0.2VCC–0.1 V VIH Input high voltage (ports 0, 1, 2, 3, EA) 0.2VCC+0.9 VCC+0.5 V VIH1 Input high voltage, XTAL1, RST 0.7VCC VCC+0.5 V VOL Output low voltage, ports 1, 2, 38 VCC = 4.5 V IOL = 1.6 mA2 0.4 V VOL1 Output low voltage, port 0, ALE, PSEN 7, 8 VCC = 4.5 V IOL = 3.2 mA2 0.4 V VOH Output high voltage, ports 1, 2, 3 3 VCC = 4.5 V IOH = –30 µA VCC – 0.7 V VOH1 Output high voltage (port 0 in external bus mode), ALE9, PSEN3 VCC = 4.5 V IOH = –3.2 mA VCC – 0.7 V IIL Logical 0 input current, ports 1, 2, 3 VIN = 0.4 V –1 –75 µA ITL Logical 1-to-0 transition current, ports 1, 2, 36 VIN = 2.0 V See Note 4 –650 µA ILI Input leakage current, port 0 0.45 < VIN < VCC – 0.3 ±10 µA ICC Power supply current (see Figure 36): See Note 5 Active mode (see Note 5) Idle mode (see Note 5) Power-down mode or clock stopped (see Fi 42 f diti ) Tamb = 0°C to 70°C <1 40 µA Figure 42 for conditions) Tamb = –40°C to +85°C 50 µA RRST Internal reset pull-down resistor 40 225 k Ω CIO Pin capacitance10 (except EA) 15 pF NOTES: 1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V. 2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the VOLs of ALE and ports 1 and 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the worst cases (capacitive loading > 100 pF), the noise pulse on the ALE pin may exceed 0.8 V. In such cases, it may be desirable to qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. IOL can exceed these conditions provided that no single output sinks more than 5 mA and no more than two outputs exceed the test conditions. 3. Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall below the VCC–0.7 specification when the address bits are stabilizing. 4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its maximum value when VIN is approximately 2 V. 5. See Figures 39 through 42 for ICC test conditions and Figure 36 for ICC vs Freq. Active mode: ICC(MAX) = (1.8 × FREQ. + 20)mA for all devices, in 6 clock mode; (0.9 × FREQ. + 20)mA in 12 clock mode. Idle mode: ICC(MAX) = (0.7 × FREQ. +1.0)mA in 6 clock mode; (0.35 × FREQ. +1.0)mA in 12 clock mode. 6. This value applies to Tamb = 0°C to +70°C. 7. Load capacitance for port 0, ALE, and PSEN = 100 pF, load capacitance for all other outputs = 80 pF. 8. Under steady state (non-transient) conditions, IOL must be externally limited as follows: Maximum IOL per port pin: 15 mA (*NOTE: This is 85 °C specification.) Maximum IOL per 8-bit port: 26 mA Maximum total IOL for all outputs: 71 mA If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 9. ALE is tested to VOH1, except when ALE is off then VOH is the voltage specification. 10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF (except EA is 25 pF). 11. Programming is guaranteed from 0 °C to Tmax for all devices. |
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