ST72334J2T3 datasheet(116/125 Pages) STMICROELECTRONICS

116 / 125 page

ST72334J/N, ST72314J/N, ST72124J

116/125

MEMORY AND PERIPHERAL CHARACTERISTICS (Cont’d)

Notes:

1) Unless otherwise specified, typical data are based on TA=25°C and VDD-VSS=5V. They are given only as design guide-

lines and are not tested.

2) Data based on characterization results, not tested in production.

3) Tested in production at TA=25°C, characterized over the whole temperature range.

4) ADC Accuracy vs. Negative Injection Current:

For IINJ-=0.8mA, the typical leakage induced inside the die is 1.6µA and the effect on the ADC accuracy is a loss of 1 LSB

for each 10K

Ω increase of the external analog source impedance. This effect on the ADC accuracy has been observed

under worst-case conditions for injection:

- negative injection

- injection to an Input with analog capability, adjacent to the enabled Analog Input

-at 5V VDD supply, and worst case temperature.

ADC Analog to Digital Converter (8-bit)

Symbol

Parameter

Conditions

Min

Typ 1)

Max

Unit

fADC

Analog control frequency

VDD=VDDA=5V

4 2)

MHz

|TUE|

Total unadjusted error 4)

TA=25°C,VDD=VDDA=5V,

fCPU=8MHz,fADC=4MHz

LSB

Offset error 4)

-0.5

0.5

Gain Error 4)

-0.5

0.5

|DLE|

Differential linearity error 4)

0.5

|ILE|

Integral linearity error 4)

0.5

VAIN

Conversion range voltage

VSSA

VDDA

IADC

A/D conversion supply current

fCPU=8MHz, fADC=4MHz

VDD=VDDA=5V

1mA

tSTAB

Stabilization time after ADC enable

µs

tLOAD

Sample capacitor loading time

µs

1/fADC

tCONV

Hold conversion time

µs

1/fADC

RAIN

External input resistor

15 2)

Ω

RADC

Internal input resistor

1.5

Ω

CSAMPLE Sample capacitor

1 LSB (ideal)

1LS B

i deal

DDA

SSA

–

256

----------------------------------------

Vin (LSBideal)

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

TUE=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

OE=Offset Error: deviation between the first actual

transition and the first ideal one.

GE=Gain Error: deviation between the last ideal

transition and the last actual one.

DLE=Differential Linearity Error: maximum devia-

tion between actual steps and the ideal one.

ILE=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

Digital Result ADCDR

255

254

253

567

253 254 255 256

(1)

(2)

TUE

DLE

ILE

(3)

VDDA

VSSA

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