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TLP5231 датащи(PDF) 10 Page - Toshiba Semiconductor |
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TLP5231 датащи(HTML) 10 Page - Toshiba Semiconductor |
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10 / 30 page ![]() TLP5231 10 11.2. 11.2. 11.2. 11.2. Switching Characteristics (Note) Switching Characteristics (Note) Switching Characteristics (Note) Switching Characteristics (Note) (Unless otherwise specified, T (Unless otherwise specified, T (Unless otherwise specified, T (Unless otherwise specified, Taaaa = -40 to 110 = -40 to 110 = -40 to 110 = -40 to 110 , V , V , V , VCC2 CC2 CC2 CC2 - V - V - V - VE E E E = 15 V, V = 15 V, V = 15 V, V = 15 V, VE E E E - V - V - V - VEE EE EE EE = 8 V) = 8 V) = 8 V) = 8 V) Characteristics Propagation delay time from DESAT threshold to 50% of high VGMOS Propagation delay time from DESAT threshold to 50% of high VOUTP Propagation delay time from DESAT threshold to 50% of high VFAULT Propagation delay time from 50% VGMOS to 50% of VOUTN DESAT Mute time DESAT leading edge blanking time DESAT filter time High-level common-mode transient immunity Low-level common-mode transient immunity Symbol t1 t2 t3 t4 tMUTE tDESAT (LEB) tDESAT (FILTER) CMH CML Note (Note 1) (Note 2) (Note 3) (Note 4) (Note 5) (Note 6) Test Circuit Fig.13.1.18 Fig.13.1.19, Fig.13.1.21 Fig.13.1.20, Fig.13.1.22 Test Condition CP = CN = 4 nF, CG = 1 nF, f = 100 Hz, duty = 50 %, IF = 8 mA, CBLANK = 200 pF, VDESAT = 8.0 V RF = 10 kΩ, CF = 1 nF, VCC1 = 3.3 or 5 V, f = 100 Hz, duty = 50 %, IF = 8 mA CP = CN = 4 nF, CG = 1 nF, f = 100 Hz, duty = 50 %, IF = 8 mA IF = 8 mA RDESAT = 100 Ω, Vin = 10 V, PW = 1 µs, monitor: VOUTP, VGMOS Ta = 25 , |VCM| = 1500 Vp-p, VCC1 = 5 V (IF = 0 mA), Rin = 220 Ω (with split resistors) Ta = 25 , |VCM| = 1500 Vp-p, VCC1 = 5 V (IF = 8 mA), Rin = 220 Ω (with split resistors) Min 0.68 ±25 ±25 Typ. 450 380 8 45 1.1 580 290 Max 750 700 20 1.7 Unit ns µs ns ms ns kV/µs Note: All typical values are at Ta = 25 . CG means the external MOSFET gate capacitance for soft gate turn-off. Note 1: Input signal duty = 50 %, tr = tf = 5 ns or less Note 2: Automatic reset time from protected operation.If the input voltage of a DESAT pin exceeds VDESAT, VOUTP moves to high level, VOUTN set to low level, VGMOS moves to high level and FAULT moves to high level, then protected operation will start. If a gate input signal returns to a low level, automatic reset of the protected operation will be carried out after tMUTE. Refer to Fig. 13.2.2 and Fig. 13.2.3. Note 3: Disabling time for incorrect detection prevention in case a gate control signal inputs.Refer to Fig. 13.2.2. Note 4: Disabling time for incorrect detection prevention when the input voltage to a DESAT pin exceeds VDESAT. ( tDESAT(FILTER) < t1, t2 ) Note 5: CMH is the maximum rate of fall of the common mode voltage that can sustained with the output voltage in the logic high state (VOUTP - VE > 12 V, VOUTN - VEE > 5 V or VFAULT > 2 V). Note 6: CML is the maximum rate of rise of the common mode voltage that can sustained with the output voltage in the logic low state (VOUTP - VE < 1 V, VOUTN - VEE < 1 V or VFAULT < 0.8 V). 2020-03-02 Rev.2.0 ©2019-2020 Toshiba Electronic Devices & Storage Corporation |
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