| поискавой системы для электроныых деталей |
|
M28R400CT-KGD датащи(PDF) 7 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
M28R400CT-KGD датащи(HTML) 7 Page - STMicroelectronics |
|
7 / 11 page ![]() 7/11 M28R400CT-KGD, M28R400CB-KGD PRODUCT TEST FLOW Figure 5. gives an overview of ST’s Known Good Die test flow. STMicroelectronics implements quality assurance procedures throughout the product test flow. In ad- dition, an off-line quality monitoring program is im- plemented to ensures that ST’s quality standards are met on Known Good Die products. With ST’s quality procedures, Known Good Die products can be produced without requiring burn- in. Figure 5. Product Test Flow Wafer Sort 1 DC Parameters Functionality Programmability Erasability BAKE 24 hours at 250˚C Data Retention Wafer Sort 2 DC Parameters Functionality Programmability Erasability BAKE 12 hours at 250˚C Wafer Sort 3 High Temperature DC Parameters Functionality Programmability Erasability Speed Packaging and Shipment Visual Inspection Sampling Wafer Pack ai08366 |
|
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |